• Optical Metrology 2015
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Internationales Congress Center
Germany, Munich
22 - 25 June 2015
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Invitation

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The Optical Metrology conference organized by SPIE Europe focuses on the latest research in optical metrology, videometrics and machine vision with applications for solving measurement and inspection problems in industrial design and production engineering, vehicle navigation, multimedia technology, biotechnology, architecture, archaeology and arts. Special emphasis is directed to model based, remote and active approaches, robot guidance, human-machine interaction, image sequence processing, sensor fusion and scene modelling, characterization of biomaterials, as well as to the preservation of our shared cultural heritage. SPIE Optical Metrology addresses attendees who are engineers, scientists, researchers, trustees and managers.

General Topics
● Optical Metrology in Industrial Design and Production Engineering
● Optical Instrumentation and Systems
● Software Systems for Optical Metrology and Inspection
● Modelling Aspects in Optical Metrology
● High-Resolution Metrology
● Videometrics, Range Imaging and Applications
● 3D Sensing and Visualization
● Autonomic Navigation
● Documentation, Preservation and Restoration of Art Work, Archaeological sites and Historical Buildings
● Inspection, Characterization and Imaging of Biomaterials and Tissues
● Multi-Modal Imaging and Inspection Technologies
● Material Recognition and Verification
● Defect Recognition
● Image Processing, Image Fusion and Image Modelling

Find out about new approaches that push optical principles of measurement and testing at the macro-, micro-, and nanoscales to the forefront of metrology. Exchange new ideas, address your shared concerns, and get access to information not yet published in the mentioned topical areas. Submit your abstract by 16 December 2014 and share your research with other engineers, scientists, researchers, and managers. If accepted, your paper will be permanently archived in the SPIE Digital Library, where it will be made available to others in the international scientific community who seek to learn, make discoveries, and innovate.

We invite all those involved in related industries to join their colleagues and share the most recent developments and applications at SPIE Optical Metrology 2015.

Symposium Chairs

Wolfgang Osten Wolfgang Osten
Univ. Stuttgart (Germany)
Gunther Notni

Gunther Notni

Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)

Andrew J. Moore Andrew J. Moore
Heriot-Watt Univ. (United Kingdom)

Technical Committee
Armando Albertazzi Goncalves, Jr., Univ. Federal de Santa Catarina (Brazil)
Jürgen Beyerer, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (Germany)
Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)
Pietro Ferraro, Istituto Nazionale di Ottica (Italy)
Karsten Frenner, Univ. Stuttgart (Germany)
Simonetta Grilli, Istituto Nazionale di Ottica (Italy)
Peter Lehmann, Univ. Kassel (Germany)
Andrew Moore, Heriot-Watt Univ. (United Kingdom)
Gunther Notni, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)
Luca Pezzati, Istituto Nazionale di Ottica-CNR (Italy)
Fernando Puente León, Karlsruhe Institute of Technology (Germany)
Fabio Remondino, FBK Trento (Italy)
Monika Ritsch-Marte, Medizinische Univ. Innsbruck (Austria)
Richard M. Silver, NIST (United States)
Mark Shortis, RMIT Univ. (Australia)
David Stifter, Johannes Kepler Univ. Linz (Austria)
Piotr Targowski, Nicolaus Copernicus Univ. (Poland)


Advisory Committee
Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)
Werner Jüptner, Bremer Institut für Angewandte Strahltechnik (Germany)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Ralph P. Tatam, Cranfield Univ. (UK)

Important Dates

Abstract Due Date
16 December 2014

Author Notification
16 February 2015

On-site Manuscripts Due
13 April 2015

Post-meeting Manuscripts Due
(O3A Conference only)
25 May 2015


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