Internationales Congress Center Munich,
Germany 21 - 25 June 2015
SPIE Optical Metrology Registration Now Open
SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.
Conferences begin 22 June. Some courses and other events occur on 21 June; registration will also be open 21 June.