• Optical Metrology 2013
    Travel to Munich
ICM Munich
Munich, Germany
13 - 16 May 2013
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SPIE Optical Metrology will return in 2015

Register for SPIE Optical Metrology 2013

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest inventions and applications in the field of optical metrology.

We look forward to seeing you in Munich 22-25 June of 2015.

Call will be posted online in spring of 2014.
Sign up for email updates to get reminders when the call is posted.

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View the Final Programme (PDF 2.5 MB)

View the Technical Abstracts (PDF 2.2 MB)


2013 Programme:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging and Applications
 • Optical Methods for Inspection, Characterization and Imaging of Biomaterials
 • Automated Visual Inspection

SPIE Optical Metrology 2013 is part of:

All papers presented at SPIE Optical Metrology 2013
become part of the world's largest collection of
optics and photonics research papers.

SPIE Optical Metrology Conference
Dynamic | Diverse | Current | Collaborative

SPIE Proceedings
Timely | Relevant | Cited | Indexed

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