• Optical Metrology 2015
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Internationales Congress Center
Munich, Germany
21 - 25 June 2015
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Attend SPIE Optical Metrology

Munich, Germany

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

Conferences begin 22 June. Some courses and other events occur on 21 June; onsite registration will also be open 21 June. 

View registration pricing and information for SPIE DSS 2015 View registration pricing and details
Prices increase after 1 June
2015 Advance Programme Download the Advance Programme (900 KB PDF)
View Hotel Information View Hotel Information

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BBC News - Science & Environment: 20 January 2015
X-ray technique reads burnt Vesuvius scroll
For the first time, words have been read from a burnt, rolled-up scroll buried by Mount Vesuvius in AD79.

2015 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

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SPIE Optical Metrology is part of:

All papers presented at SPIE Optical Metrology
become part of the world's largest collection of
optics and photonics research papers.

SPIE Optical Metrology Conference
Dynamic | Diverse | Current | Collaborative

SPIE Proceedings
Timely | Relevant | Cited | Indexed

Cooperating Organisations

 European Optical Society

Important Dates

Author Notification
19 February 2015

On-site Manuscripts Due
13 April 2015

Post-meeting Manuscripts Due
(O3A Conference only)
25 May 2015

Registration Prices Increase
1 June 2015

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