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    • Optical Metrology 2013
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SPIE Optical Metrology 2013 13 - 16 May 2013
ICM Munich
Munich, Germany

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Register for SPIE Optical Metrology 2013

Join your peers in Munich for SPIE Optical Metrology 2013, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest inventions and applications in the field of optical metrology.

Preregistration has ended for Optical Metrology 2013. Please register onsite at the meeting venue.

View the Final Programme (PDF 2.5 MB)

View the Technical Abstracts (PDF 2.2 MB)

 

Your registration gets you access to papers in these conferences:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging and Applications
 • Optical Methods for Inspection, Characterization and Imaging of Biomaterials
 • Automated Visual Inspection

SPIE Optical Metrology 2013 is part of:

All papers presented at SPIE Optical Metrology 2013
become part of the world's largest collection of
optics and photonics research papers.

SPIE Optical Metrology Conference
Dynamic | Diverse | Current | Collaborative

SPIE Proceedings
Timely | Relevant | Cited | Indexed

Cooperating Organisations

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Important Dates

Abstract Due Date
17 December 2012

Author Notification
11 February 2013

Onsite Manuscripts Due
 11 March 2013

Post-Meeting Manuscripts Due
18 April 2013
Volume 8790 only (Optics for Art, Architecture and Archaeology)


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