• Optical Metrology 2015
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Internationales Congress Center
Munich, Germany
22 - 25 June 2015
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Plan to attend SPIE Optical Metrology 2015

Munich, Germany

Present a paper at SPIE Optical Metrology 2015, the premier European conference bringing together scientists, engineers, researchers, and product developers engaged in all aspects of optical metrology.

Call for Papers (734 KB PDF)

Call for papers now open online. Submit your abstract. Click on the applicable link below.

2015 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

Co-located with Laser World of Photonics 2015 in Munich, Germany, this symposium provides an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.

Become part of the world's largest collection
of optics and photonics research papers.

Present at SPIE Optical Metrology
Dynamic | Diverse | Current | Collaborative

Publish in SPIE Proceedings
Timely | Relevant | Cited | Indexed

Cooperating Organisations

 European Optical Society

Important Dates

Abstract Due Date
16 December 2014

Author Notification
16 February 2015

On-site Manuscripts Due
13 April 2015

Post-meeting Manuscripts Due
(O3A Conference only)
25 May 2015

Present to Room-Publish to World

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