Internationales Congress Center
    Munich, Germany
    24 - 27 June 2019
    Print PageEmail Page

    SPIE Optical Metrology in Munich

    Munich, Germany

    Thank you to those who attended SPIE Optical Metrology 2017, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. The event will return in 2019.

    See what happened, view 2017 event news + photos

    SPIE Optical Metrology 2017 links

    Final programme (5 MB PDF)

    Technical abstracts (2 MB PDF)

    View 2017 event news + photos

    View details for the collocated event, SPIE Digital Optical Technologies 2017

    2017 Plenary presentations

    SPIE Plenary Session
    Federico Capasso

    Metasurface Diffractive Optics

    Federico Capasso
    Robert L. Wallace Professor of Applied Physics and Vinton Hayes Senior Research Fellow in Electrical Engineering
    Harvard Univ. (USA)

    Congress-wide Plenary Session
    Jörg Wrachtrup

    Putting a Spin on Photons

    Jörg Wrachtrup
    Univ. of Stuttgart (Germany)

    2017 Conference topics

     • Optical Measurement Systems for Industrial Inspection
     • Modeling Aspects in Optical Metrology
     • O3A: Optics for Arts, Architecture, and Archaeology
     • Videometrics, Range Imaging, and Applications
     • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
     • Automated Visual Inspection and Machine Vision

    SPIE Optical Metrology is part of

    Proceedings of SPIE

    SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

    The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

    Cooperating Organisations

     European Optical Society

    Important Dates

    Abstracts due
    9 January 2019

    Author notification
    26 February 2019

    Manuscripts due
    onsite proceedings, conf OM101, OM102, OM104, OM105, OM106
    17 April

    Manuscripts due
    post meeting proceedings, conf OM103
    27 May

    Browse Defense, Security, and Sensing 2011 papers

    Receive email updates about SPIE Optical Metrology