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Toward sub-10-nm resolution zone plates using the overlay nanofabrication processes (Proceedings Paper)

Author(s): Weilun Chao; Erik H. Anderson; Peter Fischer; Dong-Hyun Kim
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Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, Thomas J. Suleski; Winston V. Schoenfeld; Jian Jim Wang, Editors, 688309

Date: 12 February 2008

Paper Abstract

Soft x-ray zone plate microscopy has proven to be a valuable imaging technique for nanoscale studies. It complements nano-analytic techniques such as electron and scanning probe microscopies. One of its key features is high spatial resolution. We developed an overlay nanofabrication process which allows zone plates of sub-20 nm zone widths to be fabricated. Zone plates of 15 nm outer zones were successfully realized using this process, and sub-15 nm resolution was achieved with these zone plates. We ext
DOI: 10.1117/12.768878
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