: Publications: SPIE.org

Author(s): Daniel Kandel; Mike Adel; Berta Dinu; Boris Golovanevsky; Pavel Izikson; Vladimir Levinski; Irina Vakshtein; Philippe Leray; Mauro Vasconi; Bartlomiej Salski

Improved microinterferometric tomography method for reconstruction of refractive index

Author(s): Paweł Kniażewski; Małgorzata Kujawińska

High-resolution tomographic interferometry of optical phase elements

Author(s): W. Gorski; S. Rafler; W. Osten

Properties of the DMD digital micromirror device for new emerging applications in optical engineering

Author(s): Cheraina Dunn; Roland Höfling

Realisation of quantitative Makyoh topography using a digital micromirror device

Author(s): Ferenc Riesz; I. E. Lukács; J. P. Makai

A beam halo monitor based on adaptive optics

Author(s): C. P. Welsch; E. Bravin; T. Lefèvre

Realisation of a holographic microlaser scalpel using a digital micromirror device

Author(s): Susanne Zwick; Michael Warber; Tobias Haist; Wolfgang Osten

Digital micromirror device application for inline characterization of solar cells by tomographic light beam-induced current imaging

Author(s): R. Gupta; O. Breitenstein

External-cavity diode laser utilizing a micromirror device for spectral tuning

Author(s): Michael Breede; Christoph Kasseck; Carsten Brenner; Nils C. Gerhardt; Roland Höfling; Martin Hofmann

In-situ monitoring of periodic domain formation in ferroelectric crystals

Author(s): Simonetta Grilli; Melania Paturzo; Lisa Miccio; Pietro Ferraro

Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays

Author(s): Young-Sik Ghim; Joonho You; Seung-Woo Kim

DLP based fringe projection as an optical 3D inline measuring method for inspection in manufacturing

Author(s): Gottfried Frankowski; Michael Stenzel

Polarization correlometry of polarization singularities of biological tissues object fields

Author(s): O. V. Angelsky; A. G. Ushenko; A. O. Angelska; Yu. A. Ushenko

Fluid mechanics measurement based on the anisotropic core structure of pseudophase singularities in analytic signal representation of speckle pattern

Author(s): Wei Wang; Mark R. Dennis; Reika Ishijima; Tomoaki Yokozeki; Akihiro Matsuda; Steen G. Hanson; Mitsuo Takeda

Coherent fringe projector for 3D surface profilometry

Author(s): Paulo Tavares; Nuno Viriato; Jorge Reis; Mário Vaz

W-band speckle contrast images for inspection of concealed objects

Author(s): Irina Jaeger; Lixiao Zhang; Johan Stiens; Gaetan Koers; Hichem Sahli; Roger Vounckx

About the possibility of using optical bistability effect in metrology systems

Author(s): Claudia Y. Zenkova

Reaching lambda/100 resolution in static fringes interferometry using linear prediction

Author(s): Manuel Mestre; Didier Pasquelin; Peter Flug

Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera

Author(s): Y. Arai; R. Shimamura; S. Yokozeki

Phase measurement errors due to holographic interferograms compression

Author(s): Emmanouil Darakis; Vijay Raj Singh; Anand K. Asundi; John J. Soraghan

Fourier-based design of asynchronous phase detection algorithms

Author(s): José A. Gómez-Pedrero; D. Crespo; Juan A. Quiroga

Phase retrieval based on wavefront modulation

Author(s): Fucai Zhang; Giancarlo Pedrini; Wolfgang Osten

Real-time dual-wavelength digital holographic microscopy with a single hologram

Author(s): Jonas Kühn; Tristan Colomb; Frédéric Montfort; Florian Charrière; Christian Depeursinge

Fast demodulation technique for a quasi-distributed temperature sensor

Author(s): C. Crunelle; M. Wuilpart; C. Caucheteur; P. Mégret

Stability analysis for the TMS method: Influence of high spatial frequencies

Author(s): Axel Wiegmann; Clemens Elster; Ralf D. Geckeler; Michael Schulz

Characterization and compensation of decorrelations in interferometric set-ups using active optics

Author(s): Emil Hällstig; Angelica Svanbro

S-transform analysis of projected fringe patterns

Author(s): Özlem Kocahan; Serhat Özder; Emre Coşkun

Efficient mesh oriented algorithm for 3D measurement in multiple camera fringe projection

Author(s): A. V. Fantin; A. Albertazzi; T. L. Pinto

A complete digital optics applied to digital holographic microscopy: application to chromatic aberration compensation

Author(s): Tristan Colomb; Florian Charrière; Jonas Kühn; Frédéric Montfort; Christian Depeursinge

3D defect detection using optical wide-field microscopy

Author(s): Volker Tympel; Marko Schaaf; Bernd Srocka

A novel algorithm to stitch adjacent cloud of points of long cylindrical surfaces

Author(s): M. R. Viotti; A. Albertazzi; A. Dal Pont; A. V. Fantin

White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements

Author(s): P. Hlubina; D. Ciprian; R. Chlebus

Designing a new optical sensor using wide band speckle patterns

Author(s): Hatem El Ghandoor; Ashraf F. El Sherif; M. Darwish

Implementation a new real-time structure for driving an IRFPA and image enhancement

Author(s): Ali Homaei; Ehsan Koohestani

New features of Doppler-free saturated-absorption resonance in field of counterpropagating waves

Author(s): Denis V. Brazhnikov; Alexey V. Taichenachev; Anatoliy M. Tumaikin; Valeriy I. Yudin; Sergei A. Zibrov; Yaroslav O. Dudin; Peter A. Siushev; Alexander G. Radnaev; Vitaliy V. Vasil'ev; Vladimir L. Velichansky

Multidirectional holographic interferometer with dodecagon geometry

Author(s): Martin Antoš

Multi-resolution optical 3D sensor

Author(s): Peter Kühmstedt; Matthias Heinze; Ingo Schmidt; Martin Breitbarth; Gunther Notni

Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications

Author(s): Matteo Bettuzzi; Rosa Brancaccio; Maria Pia Morigi; Franco Casali

White light Fourier spectrometer: Monte Carlo noise analysis and test measurements

Author(s): Elena Stoykova; Branimir Ivanov

Non-contact torsion transducer based on the measurement of Moire patterns using plastic optical fibres

Author(s): Mauro Lomer; Kevin Contreras

Special lenslet array with long focal length range for Shack-Hartmann Wavefront Sensor

Author(s): L. P. Zhao; N. Bai; X. Li; Z. P. Fang; A. A. Hein; Z. W. Zhong

Influences of linear birefringence on bulk glass current sensors with return-back optical paths

Author(s): Zhengping Wang; Xiaoyu Liu; Zongjun Huang

Influences of reciprocal parameters upon a Faraday-mirror typed OCT

Author(s): Zongjun Huang; Zhengping Wang; Xiaoyu Liu; Chong Kang

Orthogonal conjugate reflecting current sensor

Author(s): Zongjun Huang; Zhengping Wang; Hongyu Wang

Optical fiber rotation sensor for application in oil refinery and high electromagnetic noise environment

Author(s): Tomasz R. Woliński; Daniel Budaszewski; Andrzej W. Domański; Sławomir Ertman; Grzegorz Goleniewski; Michał Wydmański

Method of optical axis determination in crystals by use of light depolarization measurements

Author(s): Andrzej W. Domanski; Daniel Budaszewski; Pawel Poziemski; Tomasz R. Wolinski

Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer

Author(s): Adam Styk; Krzysztof Patorski

Influence of nonlinearities in wavelength-swept absolute distance interferometry

Author(s): Luc Perret; Pierre Pfeiffer; Ayoub Chakari

Proposal on MEMS-based interferometric profiler for in-situ etching depth control

Author(s): Andrei G. Smirnov; Juergen Schreiber; Uwe Richter; Ingo Wullinger

Improving the measurement of thick and thin films with optical profiling techniques

Author(s): Cristina Cadevall; Carles Oriach-Font; Roger Artigas; Agustí Pintó; Ferran Laguarta

Interferometry of thick and thin films

Author(s): Michael Conroy

Precision mechatronics based on high-precision measuring and positioning systems and machines

Author(s): Gerd Jäger; Eberhard Manske; Tino Hausotte; Rostyslav Mastylo; Natalja Dorozhovets; Norbert Hofmann

Experimental validation of 20nm sensitivity of singular beam microscopy

Author(s): Boris Spektor; Alexander Normatov; Joseph Shamir

Measuring 3D geometries of microstructures with the laser-scanning confocal vibrometer microscope

Author(s): Christian Rembe; Sebastian Bödecker; Bernd Armbruster; Martin Bauer

Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements

Author(s): N. Dorozhovets; T. Hausotte; G. Jäger; E. Manske

Grating projection Moire interferometry for high-speed 3D inspection of mesoscale objects

Author(s): Sang-Yoon Lee D.D.S.; Min-Gu Kang; Seung-Woo Kim

Artefacts with rough surfaces for verification of optical microsensors

Author(s): Wiebke Ehrig; Ulrich Neuschaefer-Rube D.V.M.

Superposition fringes for profiling applications

Author(s): J. Schwider

Using phase objects to qualify the transfer function of Fizeau interferometers for high spatial frequencies

Author(s): Stéphane Bouillet; Jérôme Daurios D.D.S.

New technique for flexible and rapid measurement of precision aspheres

Author(s): Eugenio Garbusi; Christof Pruss; Jan Liesener; Wolfgang Osten

Surface metrology with a stitching Shack-Hartmann profilometric head

Author(s): J. Floriot; X. Levecq; S. Bucourt; M. Thomasset; F. Polack; M. Idir; P. Mercère; S. Brochet; T. Moreno

Large-scale full-field metrology using projected fringes: some challenges and solutions

Author(s): Jonathan M. Huntley; Tokunbo Ogundana; Richard L. Burguete; C. Russell Coggrave

Optical scanner for the measurement of surface profile of large size panels: analysis of metrologic performance and measurement uncertainty

Author(s): Paolo Castellini

Measurement errors of mirrorlike, tilted objects in white light interferometry

Author(s): Reinhard Berger; Thomas Sure; Wolfgang Osten

3D optical measurement of curved edges

Author(s): S. Naudet-Collette; F. Gaspard; H. Martinsson; F. Dekeyser

Optical correlation measurement of surface roughness

Author(s): Oleg V. Angelsky; Alexander P. Maksimyak; Peter P. Maksimyak

Profile detection by projection of coloured patterns

Author(s): Daniela Fontani; Franco Francini; Paola Sansoni; David Jafrancesco; Luca Mercatelli

Nonlinearity correction in digital fringe projection profilometry by using histogram matching technique

Author(s): Hongwei Guo; Zhan Zhao

Two-dimensional method for surface determination by optical deflectometry

Author(s): A. Moreno; M. Espínola; A. Lizana; J. Campos

Optical scan method for fine surface roughness measurement

Author(s): Zhengping Wang; Lihui Wang

Conical beam-based laser profilometer for testing roller bearings

Author(s): Nikolai Khilo; Vladimir Belyi; Nikolai Kazak; Aleksander Mashchenko; Piotr Ropot

Correlation method for shape measurement of optical surfaces

Author(s): Antonin Miks; Jiri Novak; Pavel Novak

Accurate measurement of intraocular lens parameters

Author(s): Maurizio Vannoni; Giuseppe Molesini; Rita Mencucci; Roberto Volpe

Digital holocameras for laboratory and outdoor measurements of engineering objects

Author(s): Aneta Michalkiewicz; Malgorzata Kujawinska; Karol Stasiewicz; Leszek R. Jaroszewicz

Infrared Electronic speckle pattern interferometry at 10 μm

Author(s): J.-F. Vandenrijt; M. Georges

Stress behavior of ball grid array (BGA) studied by dynamic electronic speckle pattern interferometry (DESPI)

Author(s): Violeta Dimitrova Madjarova; Satoru Toyooka; Hiroyuki Chida; Hirofumi Kadono

Measurement of surface strain using multi-component pulsed laser shearography with coherent fibre-optic bundles

Author(s): D. Francis; S. W. James; R. P. Tatam

Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing

Author(s): Vladimir S. Pisarev; Vitaly V. Balalov

Nematic liquid crystals light valve: application to phase shifting speckle interferometry

Author(s): Pierre Slangen; Benoit Gautier

Advances in optoelectronic methodology for micro- and nano-scale measurements

Author(s): Ryszard J. Pryputniewicz

In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe

Author(s): Patrick Sandoz; Jean-Michel Friedt; Émile Carry

Measurement of the thermal deformation of a highly stable antenna with pulse ESPI

Author(s): E-H. Nösekabel; T. Ernst; W. Haefker

Projection Moire measurement of the deflection of composite plates subject to bird strike impact

Author(s): A. Shulev; W. Van Paepegem; J. Harizanova; A. Moentjens; J. Degrieck; V. Sainov

Double exposure time-averaged in-line digital holography

Author(s): Vijay Raj Singh; Anand Asundi; Jianmin Miao

Deformation analysis in biomaterials using digital speckle interferometry

Author(s): R. Salvador; R. González-Peña; R. Cibrián; M. Buendía; F. Mínguez; V. Micó; J. A. Carrión; J. J. Esteve-Taboada; T. Molina-Jiménez; S. Simón; E. Pérez

Quantification of displacement and velocity noise in vibrometer measurements on transversely moving or rotating surfaces

Author(s): Alexander Dräbenstedt

Development of a 3D dynamic measurement system using a high speed camera with white light scanning interference microscopy associated with real-time FPGA image processing

Author(s): Gyasi Johnson; Paul Montgomery; Freddy Anstotz; Renaud Kiefer

Interferometric characterization of capacitor micromachined ultrasonic transducers and validation by electrical measurements

Author(s): Hanne Martinussen; Astrid Aksnes; Helge E. Engan; Arne Rønnekleiv

Fibre grating refractometer sensors for composite process monitoring

Author(s): Stephen J. Buggy; Edmond Chehura; Alexandros A. Skordos; Athanasios Dimopoulos; Stephen W. James; Ivana K. Partridge; Ralph P. Tatam

Quantification of defect size in shearing direction by shearography and wavelet transform

Author(s): Fabrice Michel; Vincent Moreau; Vanessa Rosso; Serge Habraken; Bernard Tilkens

Simulation of the elastic wave propagation in anisotropic microstructures

Author(s): Juerg Bryner; Jacqueline Vollmann; Dieter M. Profunser; Jurg Dual

Online monitoring of the laser brazing of titanium overlap joints

Author(s): R. Schmitt; K. Vielhaber; D. Donst; F. Klocke

Fiber optic strain measurement for machine monitoring

Author(s): L. Hoffmann; M. S. Mueller; A. W. Koch

Interference microscopes for tribology and corrosion quantification

Author(s): Erik Novak; Nelson Blewett; Tom Stout

Fiber optic-based sensors design to test concrete structures

Author(s): V. Micó; M. L. Lozano; J. J. Esteve-Taboada; J. A. Carrión; T. Molina-Jiménez; S. Simón; E. Pérez; J. M. Lloris; M. Cruz-Yusta; M. J. López-Tendero; C. Silvestre; F. López; D. Barrera-Villar; R. García-Olcina; S. Sales

Performance of optical speckle displacement technique near-stress concentrators

Author(s): Leonid I. Muravsky; Olexander M. Sakharuk; Sergiy O. Kostyukevych; Olexander P. Maksymenko; Kateryna V. Kostyukevych

Phase only SLM as a reference element in Twyman-Green laser interferometer for MEMS measurement

Author(s): Jacek Kacperski; Malgorzata Kujawinska

Validation of an algorithm for wave propagations in graded materials with an analytical solution

Author(s): L. Aebi; K. Löffel; J. Vollmann; J. Dual

Optical fiber sensors in health monitoring of composite high-pressure vessels for hydrogen

Author(s): Paweł Gąsior; Jerzy Kaleta; Anna Sankowska

Feasibility study of in-process weld quality control by means of scanning laser profilometry

Author(s): Matija Jezeršek; Ivan Polajnar; Janez Diaci

Performance of a fiber optic ring depolarizer in fiber sensing applications

Author(s): M. S. Mueller; L. Hoffmann; A. W. Koch

Laser ultrasound: a flexible tool for the inspection of complex CFK components and welded seams

Author(s): Christoph von Kopylow; Oliver Focke; Michael Kalms

Multi-technique platform for dynamic and static MEMS characterisation

Author(s): Kay Gastinger; Pål Løvhaugen; Øystein Skotheim; Ola Hunderi

Terahertz multiwavelength phase imaging without 2&pgr; ambiguity

Author(s): Yan Zhang; Liangliang Zhang; Cunlin Zhang

Fiber-coupled THz spectroscopy for monitoring polymeric compounding processes

Author(s): N. Vieweg; N. Krumbholz; T. Hasek; R. Wilk; V. Bartels; C. Keseberg; V. Pethukhov; M. Mikulics; L. Wetenkamp; M. Koch

Inspection of plastic weld joints with terahertz imaging

Author(s): S. Wietzke; N. Krumbholz; C. Jördens; B. Baudrit; M. Bastian; M. Koch

On-axis, non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy

Author(s): Rainer Wilhelm; Alain Courteville; Fabrice Garcia; François de Vecchi

Multiscale segmentation method for small inclusion detection in 3D industrial computed tomography

Author(s): G. Zauner; B. Harrer; D. Angermaier; M. Reiter; J. Kastner

Polarization metrology of speckle-reconstructed biological layers roughness

Author(s): I. Z. Misevitch; Yuriy Ushenko; A. G. Ushenko

Shape and vibration measurement of fast rotating objects employing novel laser Doppler techniques

Author(s): Thorsten Pfister; Philipp Günther; Lars Büttner; Jürgen Czarske

AIT of optical payloads in Thales Alenia Space-F: an experience of more than 20 years

Author(s): Rachel Thibout; Hervé Benard; Stéphane Delmonte; Jean-Philippe Chessel

Depth tracing the influence of oxygen on UV curing

Author(s): Stefan Pieke; Wolfgang Heering

XtremeFringe: state-of-the-art software for automatic processing of fringe patterns

Author(s): J. Antonio Quiroga; Daniel Crespo; J. A. Gomez-Pedrero

Optical and contact nondestructive measurement of the laser remelting layers

Author(s): Hana Chmelíčková; Hana Lapšanská; Helena Hiklová; Martina Havelková; Rostislav Medlín; Petr Beneš

Laser metrology of statistical and fractal structure of biological tissues polarization images

Author(s): Oleg Angelsky; Alexander Prydij; Alexander Ushenko; Yuriy Ushenko; Olena Olar

Metrology of biological tissue coherent images by means of estimation of complex degree of mutual polarization

Author(s): I. Z. Misevitch; A. G. Ushenko; Yu. A. Ushenko; Yu. Ya. Tomka

Mass transfer studies in transparent liquid solutions by polarization imaging

Author(s): Vani K. Chhaniwal; B. S. Chakrabarty; Arun Anand

Digital Shack-Hartmann Wavefront Sensor for toroidal surface measurement

Author(s): N. Bai; Li. P. Zhao; X. Li; Zhong P. Fang

Optical metrology devices for high-power laser large optics

Author(s): J. Daurios D.D.S.; S. Bouillet; G. Gaborit; J. C. Poncetta

Purity of iodine cells in relation to frequency shift of iodine stabilized Nd:YAG laser

Author(s): Jan Hrabina; František Petru; Petr Jedlička; Ondřej Číp; Josef Lazar

Total spectral radiant flux measurements on Xe excimer lamps from 115 nm to 1000 nm

Author(s): Klaus E. Trampert; Mark Paravia; Rüdiger Daub; Wolfgang Heering

Efficient LED spatial measurement to improve optical modeling

Author(s): P. Blanco; A. Cifuentes; J. Arasa; C. Pizarro; S. Royo

Adopting our heterodyne interferometer with sub-nm sensitivity for industrial position metrology

Author(s): Thilo Schuldt; Martin Gohlke; Dennis Weise; Achim Peters; Ulrich Johann; Claus Braxmaier

Thin film thickness measurement by double laser interferometry

Author(s): M. Domingo; C. Millán; M. A. Satorre; J. Cantó

3D digitising using structured illumination: application to mould redesign

Author(s): L. Granero; J. Sánchez; V. Micó; J. J. Esteve; J. Hervás; S. Simón; E. Pérez

Measurement of index of refraction of air by optical frequency method

Author(s): Radek Šmíd; Martin Čížek; Zdeněk Buchta; Břetislav Mikel; Josef Lazar; Ondřej Číp

Force plate for measuring small animal forces by digital speckle pattern interferometry

Author(s): M. Pilar Arroyo; José Antonio Bea; Nieves Andrés; Rosario Osta; Manuel Doblaré

Design of an optical scanner for real time on-line measurement of wood-panel profiles

Author(s): Paolo Castellini; Andrea Bruni; Nicola Paone

Particles size measurement by spectrophotometric method

Author(s): Daniela Fontani; Franco Francini; Paola Sansoni; David Jafrancesco; Luca Mercatelli

Absolute interferometric measurement of flatness: application of different methods to test a 600 mm diameter reference flat

Author(s): Franck Morin; Stéphane Bouillet

Determination of lens parameters with digital holography

Author(s): Vani K. Chhaniwal; Arun Anand

Optical Measurement Systems for Industrial Inspection V (Proceedings Volume)

Table of Contents