Optical Engineering Editorial Board

Ronald G. Driggers
U.S. Naval Research Laboratory, USA

David D. Allred
Brigham Young University, USA
Specialty: ultraviolet and x-ray optics

V. Michael Bove, Jr.
Massachusetts Institute of Technology, USA
Specialty: image and signal processing, displays, computer vision

Casimer DeCusatis
IBM Corp., USA
Specialty: fiber optics

Benjamin B. Dingel
Nasfine Photonics, Inc., USA
Specialty: optical fiber communications and networking, photonic components and devices

Reiner Eschbach
Xerox Corp., USA
Specialty: image processing, color

Patti Gillespie
Army Research Laboratory, USA
Specialty: atmospheric optics and propagation, hyperspectral technology

G. Groot Gregory
Optical Research Associates, USA
Specialty: interferometry

Jürgen Jahns
University of Hagen, Germany
Specialty: optical interconnects, micro-optics

Francois Kajzar
CEA Saclay, France
Specialty: nonlinear optics

Daniel Malacara-Hernandez
Centro de Investigaciones en Optica, A.C., Mexico
Specialty: optical testing, optical design, interferometry

Edris Mohammed
Intel Corp., USA
Specialty: optical interconnects

Andrea Prati
University of Modena and Reggio Emilia, Italy
Specialty: computer vision, image processing, pattern recognition

Gregory J. Quarles
VLOC, USA
Specialty: lasers

Giancarlo C. Righini
IROE, National Research Council, Italy
Specialty: integrated optics

Raymond C. Rumpf
Prime Research, LC, USA
Specialty: Fourier optics, diffractive optics

Gregory M. Sanger
SpectraSensors, Inc., USA
Specialty: optical fabrication, optical testing, general optical engineering

Rajpal S. Sirohi
Indian Institute of Technology Madras, India
Specialty: interferometry

Alan F. Stewart
Boeing Co., USA
Specialty: thin films

Bryan D. Stone
Optical Research Associates, USA
Specialty: lens design

Andrew G. Tescher
AGT Associates, USA
Specialty: image compression, image and signal processing, video technologies

Sergio A. Velastin
Kingston University, United Kingdom
Specialty: image processing and machine vision

Richard Vollmerhausen
Electro-Optical Systems Analyst, USA
Specialty: infrared systems and radiometry

David J. Webb
Aston University, United Kingdom
Specialty: fiber optic sensors

Van A. Hodgkin
U.S. Army, USA
SPIE Defense, Security, and Sensing

Mark S. Mirotznik
University of Delaware, USA
SPIE Photonics West

William S. Rabinovich
U.S. Naval Research Laboratory, USA
SPIE Optics + Photonics

Eddie Jacobs
University of Memphis, USA
Associate Editor, Student Advisory Board

Amber M. Beckley
University of Rochester

Roland Himmelhuber
University of Arizona

Joshua K. Lentz
University of Central Florida

Forrest A. Smith
University of Memphis

Andrew J. Stark
Georgia Institute of Technology

John P. Wilson
University of Delaware