SPIEDigitalLibrary.org
SPIEWorks.com
MySPIE.org
SPIE is an international society
advancing light-based research.
Contact Us
Help
Shopping Cart
Create an account
|
Sign in
Conference Proceedings
Research Papers
SPIE Digital Library
Journals
Optical Engineering
Journal of Biomedical Optics
Journal of Electronic Imaging
Journal of Micro/Nanolithography, MEMS, and MOEMS
Journal of Applied Remote Sensing
Journal of Nanophotonics
SPIE Letters Virtual Journal
SPIE Journals on CD-ROM
Subscriptions
Books
Collections on CD-ROM
Contact SPIE Publications
Information for:
Journal Authors
Journal Reviewers
SEARCH:
IN:
All Types of Publications
Conference Proceedings Volumes
Papers in Journals & Proceedings
Journal Papers Only
SPIE Press Books
Special Collections
Keywords, title, author/editor, volume#, or ISBN
Journal of Electronic Imaging Letters
JEI Letters
The SPIE Letters Virtual Journal is an open-access, online collection. This table of contents links to free abstracts and free full-text downloads of all letters published in the
Journal of Electronic Imaging
.
2008
|
2007
|
2006
|
2005
2008
Computer-aided recognition of a four-chamber image plane in three-dimensional echocardiographic images of children
Volume:
17
Date:
1 July 2008
Texture features based on local Fourier histogram: self-compensation against rotation
Volume:
17
Date:
1 July 2008
New class of top-hat transformation to enhance infrared small targets
Volume:
17
Date:
1 July 2008
High-speed parallel very large scale integration architecture for global stereo matching
Volume:
17
Date:
1 January 2008
Innovation Starts Here
Go to the SPIEDigitalLibrary.org
Journals Feature Multimedia
Audio and video display is fully supported for all SPIE Journals through standard multimedia platforms. Click below for more information.
Journal Authors
Featured Product
Logic-based Nonlinear Image Processing
Author(s):
Stephen Marshall
Member:
$34.00
Non-member:
$41.00
Publish Your Work
Thousands of people from academia, industry, and national labs publish their work with SPIE every year. Get the recognition you deserve.
Proceedings Authors
Journal Authors
Book Authors
About SPIE
|
SPIEWorks Job Site
|
Privacy Policy
|
Sitemap
Copyright © SPIE