Millennium Harvest House Hotel
    Boulder, Colorado, United States
    25 - 28 September 2016
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    Thin Film Damage Competition

    A double blind laser damage competition will be held to determine the current laser resistance of excimer HR coatings in the industrial and university sectors. The results will be shared at the 2011 Laser Damage Symposium. The coatings must meet the following requirements: 

    • Reflectance >97% at 193 nm  
    • 0 degrees incidence angle, unpolarized 
    • 15 ns pulse length 
    • Ambient temperature, humidity, and pressure environment 
    • No wavefront, stress, or surface quality requirement

    The coatings shall be deposited on substrates provided by the coating supplier. The dimensions of the substrate shall be 38.5 mm (±1 mm) in diameter and 10 mm (±1 mm) thick. Samples must be received by June 15, 2011 to the following address:

    Christopher Stolz, L-491
    Lawrence Livermore National Laboratory
    7000 East Avenue
    Livermore, CA 94550

    The samples will be damage tested according the ISO 11254-2 measurement protocol at Laser Zentrum Hannover e.V. in Germany. Each sample will be assigned a unique label to maintain anonymity. The origin of the samples will not be released to the damage testing service and also will not be published at the Laser Damage Symposium or within the proceedings. A summary of the results will be published in the conference proceedings. Coating suppliers will be informed of the measured results and relative ranking within the submitted population. In order to minimize the number of damage tests, no more than two different samples can be submitted from each coating supplier.

    In addition to the thin film sample, the coating supplier MUST also include the following information:   

    • Number of layers
    • Number of materials and material types 
    • Reflectance spectral scan or 193 nm laser reflectometer measurement (prefer in an electronic format) 
    • Spectral scans may be emailed to stolz1@llnl.gov
    • A brief description of the deposition method (e-beam, IAD, IBS, CVD, plasma assist, etc.)
    • Substrate material

    Failure to provide the required information will result in the sample not being tested. If two samples are submitted, the vendor must describe the manufacturing differences between the two samples. Optical or scanning electron microscopy may be used to image damage sites. Reflectance measurements may also occur. No other characterization tools will be used on the samples to protect any proprietary features of the samples. Samples will be returned if requested.


    Technical Cosponsor

    Laser Zentrum Hannover e.V. logo

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