Print PageEmail Page

    Author Submission & Chair Review System

     


    International Conference on Image Processing and Pattern Recognition in Industrial Engineering (IPPRIE 2011)
    Dates: 30-31 July 2011
    Location: Yanxue Forum, Beijing, China


    Paper submissions for the International Conference on Image Processing and Pattern Recognition in Industrial Engineering Conference (IPPRIE 2011) will go through the SPIE Paper Submission and Review System.

    Create an Account with SPIE

    Already have an SPIE account? Sign in now
    An account is required to submit a manuscript, or review manuscript submissions for this conference.

    Submit Your Manuscript
    You will be asked to provide information about your submission, including complete author information. You will receive an email once your manuscript has been quality checked.

    Please submit your manuscript to the appropriate volume:

    IP400: Image Acquisition and Processing, Pattern Recognition, and Computer Vision in Industrial Engineering

    IP500: Sensor Technology, GIS, GPS, RS and Wireless and Optical Communications in Industrial Engineering

    Due Date: 5 April 2011: Full length manuscript. Proceedings will be published prior to the meeting.

    Manage Your Active Submissions
    Authors:
    Complete your submission, submit a revision, or view the status of your manuscript.

    Chairs and Committe Members: Access and review manuscripts.


    For assistance, please contact Jenny Woods, SPIE Proceedings Coordinator, jennyw@spie.org, or call +1 360 676 3290. SPIE hours are Monday-Friday, 8 am to 5 pm Pacific Time.