A double blind laser damage competition will be held to determine the current laser damage resistance of Brewster angle thin film plate polarizing beam splitters. The results will be shared at the 2013 Boulder Damage Symposium. The polarizing optic must meet the following equirements:
- Tp > 95% at 1064 nm
- Rs > 99% at 1064 nm
- 56.4 degrees incidence angle
- Ambient temperature, humidity, and pressure environment
- No wavefront, stress, or surface quality requirement
The coatings shall be deposited on substrates provided by the coating supplier. The dimensions of the substrate shall be 50 mm (±1 mm) in diameter and 10 mm (±1 mm) thick. Samples must be received by June 18, 2013 at the following address:
Christopher Stolz, L-491
Lawrence Livermore National Laboratory
7000 East Avenue
Livermore, CA 94550
Each sample will be assigned a unique label to maintain anonymity. The origin of the samples will not be released to the damage testing service and also will not be published at the Laser Damage Symposium or within the proceedings. A summary of the results will be published in the conference proceedings. Participants will be informed of the measured results and relative ranking within the submitted population. In order to minimize the number of damage tests, no more than two different samples can be submitted from each participant.
In addition to the sample, the participant MUST also include the following information:
- Number of materials and material types
- Number of coating layers
- A brief description of the deposition method
- A brief description of the cleaning method.
- Substrate material
- Spectral scan (email to firstname.lastname@example.org)
Failure to provide the required information will disqualify the sample. If a second sample is submitted, the vendor must describe the manufacturing differences between the two samples. Optical or scanning electron microscopy may be used to image damage sites. Reflectance measurements may also occur. No other characterization tools will be used on the samples to protect any proprietary features of the samples. Samples will be returned at the conference if requested.