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San Jose Convention Center
San Jose, California, United States
21 - 25 February 2010
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SPIE Advanced Lithography 2010 - Past Event Overview

Plenary audience at SPIE Advanced Lithography 2010.


SPIE Advanced Lithography brings together the most innovative minds in optical lithography, resists, metrology, EUV, immersion, double patterning, DFM, and imprint lithography.

SPIE Advanced Lithography 2010 concluded 25 February. Dates for 2011 are confirmed: 27 February - 4 March in San Jose, California, USA.

View the current Advanced Lithography website

Advanced Lithography 2010 featured plenary presentations from industry leaders, over 2,100 attendees, and a successful exhibition.

See information on all aspects of the 2010 event:

The event featured conferences, courses, and an exhibition covering:

EUV—sources, components, yields, resists, modeling
Alternative Technologies—maskless, nano-imprint, directed self-assembly
Optical lithography—computational, double patterning, SMO, OPC, RET
Metrology, inspection, process control, LER/LWR, mask litho, DBM
Resists materials and processing, double patterning, immersion, LER
DFM/DPI—co-optimization, layout, electrical, methodologies

Plenary Speakers:


Kazuo Ushida
President
Precision Equipment Co.
Nikon Corp.

Eric Chen
Managing Director
Silver Lake Partners

Sam Sivakumar
Director of Lithography
Portland Technology Development Group
Intel Corp.


Symposium Chairs:

Christopher J. Progler
Photronics Inc.
2010 Symposium Chair
Donis G. Flagello
Nikon Research Corp. of America
2010 Symposium Co-Chair


Executive Committee
Robert D. Allen, IBM Almaden Research Ctr.
Will Conley, Freescale Semiconductor, Inc.
Mircea V. Dusa, ASML US,Inc.
Donis G. Flagello, Nikon Research Corp. of America
Daniel J. C.  Herr, Semiconductor Research Corp.
Bruno La Fontaine, GLOBALFOUNDRIES Inc.
Patrick P. Naulleau, Lawrence Berkeley National Lab.
Christopher J. Progler, Photronics, Inc.
Christopher J. Raymond, Nanometrics, Inc.
Michael L. Rieger, Synopsys, Inc.
Mark H. Somervell, Tokyo Electron America, Inc.
Alexander Starikov, I&I Consulting
Joerg Thiele, Qimonda AG (Germany)
William M. Tong, Consultant

Advisory Committee
Robert D. Allen, IBM Almaden Research Ctr.
William H. Arnold, ASML US, Inc.
Timothy A. Brunner, IBM Thomas J. Watson Research Ctr.
Ralph R. Dammel, AZ Electronic Materials USA Corp.
Roxann L. Engelstad, Univ. of Wisconson, Madison
Roderick R. Kunz, MIT Lincoln Lab.
Harry J. Levinson, Advanced Micro Devices, Inc.
Burn Lin, Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan)
Chris A. Mack, lithoguru.com
Victor Pol, Freescale Semiconductor, Inc.
Michael T. Postek, National Institute of Standards and Technology
Luc Van den Hove, IMEC (Belgium)
C. Grant Willson, The Univ. of Texas at Austin
Anthony Yen, Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan)