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Lasers & Sources

NanoScan beam profiler with measurement capability


Photon, a leading manufacturer of beam profiling optical test equipment, announces a new feature for pulsed laser measurement with its NanoScan Beam Profiler. The NanoScan now measures and reports the actual frequency of the laser. Often the pulse frequency is unknown or is not exactly as specified by the manufacturer. Knowing the exact frequency allows the NanoScan to provide a more stable and accurate profile.

The NanoScan employs the scanning slit beam profiling technique, which provides higher accuracy and resolution than is possible with typical camera-type profilers. The pulsed measurement capabilities of the NanoScan: high-resolution beam size, beam position, and beam profile measurements can be performed on pulsed lasers operating at 1 kHz or higher repetition rate.

Photon offers the pulsed measurement option standard with every one of its NanoScan models. This includes the NanoScan with silicon detector for operation at 350-1000 nm wavelengths, the NanoScan with germanium detector for 700-1800 nm wavelengths, and the NanoScan with pyroelectric detector for 190 nm - 20 micron wavelengths at beam powers up to 1 kWatt at certain wavelengths. The NanoScan can accurately measure continuous wave beams as small as 4 microns and as large as 20 mm. Minimum beam sizes for pulsed beams are dependent on the pulse frequency. The system includes a power measurement window with most models such that beam size, beam position, beam profile, and beam power can be generated in a single measurement.