• Conference Proceedings
  • Journals
  • Journal of Applied Remote Sensing
    JARS Information for Authors
    Journal of Astronomical Telescopes, Instruments, and Systems
    Journal of Biomedical Optics
    Journal of Electronic Imaging
    Journal of Medical Imaging
    Journal of Micro/Nanolithography, MEMS, and MOEMS
    Journal of Nanophotonics
    Journal of Photonics for Energy
    Neurophotonics
    Optical Engineering
    Individual Subscriptions
    Institutional Subscriptions
    SPIE Journals on CD-ROM
  • SPIE Digital Library
  • Books
  • Collections
  • Open Access
  • Contact SPIE Publications
Print PageEmail Page

Journal of Applied Remote Sensing

Ni-Bin Chang, University of Central Florida
Editor-in-Chief

Read the press release about Prof. Chang's appointment as editor-in-chief of the Journal of Applied Remote Sensing.

Editorial Board

The Journal of Applied Remote Sensing (JARS) covers the concepts, information, and progress of the remote sensing community. View full journal scope

JARS Intro Video Introduction to the Journal of Applied Remote Sensing from the Editor-in-Chief, Ni-Bin Chang.

Special Section Calls for Papers

Facts and Figures

E-ISSN: 1931-3195
Publisher: SPIE
Frequency: Annual (1 volume/year); articles published continuously throughout the year.
Format: Online only
Impact Factor: 0.892*
5-Year Impact Factor: 1.025* 
Subject Category Rankings: 22nd out of 27 journals in Remote Sensing; 15th out of 23 journals in Imaging Science & Photographic Technology; 172nd out of 215 journals in Environmental Sciences*
h5-index: 19

* 2014 Release of Journal Citation Reports with "Source: 2013 Web of Science data." Journal Citation Reports is a registered trademark of Thomson Reuters. All rights reserved.
h5-index is the h-index for articles published in the last 5 complete years. It is the largest number h such that h articles published in 2009-2013 have at least h citations each (from Google Scholar)

Abstracting and Indexing

  • Science Citation Index Expanded
  • Current Contents - Agriculture, Biology & Environmental Sciences
  • Current Contents - Physical, Chemical & Earth Sciences
  • Inspec
  • Scopus
  • Ei Compendex
  • Astrophysics Data System

Editorial Office

Contact the Journal of Applied Remote Sensing staff at:

SPIE
P.O. Box 10
Bellingham, WA 98227-0010 USA
tel: +1 360 676 3290
fax: +1 360 647 1445
journals@spie.org

 


Access

Read JARS Online 
Recommend to your Librarian 
Subscriptions for Individuals
Institutional Subscriptions
Authors

Submit a Manuscript to JARS 
JARS Author Information
Calls for Papers
Code of Ethics
Additional Information

Editorial Board
Reviewer Information
Terms of Use
Mailing Schedule and Claims
Staff
Publication Charges