International Radiation Detectors, Inc. (IRD), the premier manufacturer of semiconductor radiation sensors for detecting photons and other particles, announces the AXUV 100GX Absolute X-ray Photodiode. The new X-ray detector possesses known active silicon thicknesses and 100 percent internal quantum efficiency, making possible absolute measurement of X-ray flux with energies 100 keV and beyond. X-ray responsivity measurements performed at PTB Germany confirm the responsivity of AXUV 100GX devices can be calculated from their known silicon thickness.
IRD's AXUV 100GX photodiode features a large (10 mm x 10 mm square) active area with room-temperature operation and a small detector footprint. AXUV 100GX is very simple to use and, unlike other X-ray detectors, requires no external voltage for operation. The nitrided-oxide front window of the AXUV 100GX diode provides up to a Gigarad (SiO2) of radiation hardness which is 10,000 times greater than standard PIN silicon photodiodes. Photodiodes with directly-deposited, thin-metallic filters are available for reducing response to visible light by several orders of magnitude. IRD's advanced sensors are used internationally by synchrotron scientists and by space scientists for the solar spectrum studies.