Conferences & Exhibitions Calendar
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SPIE Optical Metrology 23 - 26 May 2011
ICM—International Conference Centre Munich
Munich, Germany

Due Dates and SPIE Contacts

Abstract Due Date: 16 December 2010

Author Notification: 7 February 2011

For questions about your presentation or the meeting, please contact your SPIE Conference Programs Coordinator from the list below.

Manuscript Due Date for Onsite Proceedings Volumes: 14 March 2011

The MySPIE.org Manuscript Submission Site will open 7 February 2011 for onsite Proceedings volumes.

Manuscript Due Date for Post-Meeting Volumes: 25 April 2011

The MySPIE.org Manuscript Submission Site will open 28 March 2011 for post-meeting Proceedings volumes.

For questions about your presentation or the meeting, please contact your SPIE Proceedings Coordinator from the list below.

Vol. No.TitleManuscript Due DateProgram CoordinatorProceedings Coordinator
8082Optical Measurement Systems for Industrial Inspection14 Mar 2011*Alex Pulchart Rusova Jenny Woods
8083Modeling Aspects in Optical Metrology14 Mar 2011*Alex Pulchart Rusova Mercedes Elg
8084O3A: Optics for Arts, Architecture, and Archaeology25 Apr 2011Alex Pulchart Rusova Mercedes Elg
8085Videometrics, Range Imaging, and Applications25 Apr 2011Alex Pulchart Rusova Mercedes Elg

*This Proceedings volume will be made available at the meeting.

Important Dates

Abstract Due Date
16 December 2010

Author Notification
18 February 2011

Onsite Manuscripts Due 
14 March 2011

Post-Meeting Manuscripts Due
25 April 2011


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