SPIE Reviews Editorial Board
Editor William T. Rhodes
Florida Atlantic University
Imaging Technology Center
Boca Raton, Florida 33431, USA
Tel: +1 561 297 2338
wrhodes@fau.edu
Editorial Board Members
Ali Adibi
Georgia Institute of Technology, USA
Tatiana Alieva
Universidad Complutense de Madrid, Spain
Oleg Angelsky
Yuriy Fedkovych Chernivtsi National University, Ukraine
James Bilbro
JB Consulting International, USA
Roman Castañeda
National University of Colombia - Medellín Campus, Colombia
H. John Caulfield
Fisk University and Alabama A&M University, USA
Arthur Chiou
National Yang-Ming University, Taiwan
Gerd Häusler
University of Erlangen-Nürnberg, Germany
Jean-Pierre Huignard
Thales Research & Technology, France
Bahram Javidi
University of Connecticut, USA
Hypolito Kalinowski
Universidade Tecnológica Federal do Paraná, Brazil
Ignor N. Kompanets
P.N. Lebedev Physical Institute, Russia
Philippe Lalanne
Institut d'Optique, France
Harry Levinson
Advanced Micro Devices, Inc., USA
María S. Millán
Technical University of Catalonia, Spain
Levent Onural
Bilkent University, Turkey
Henri Rajbenbach
European Commission, Directorate General Information Society and Media, Belgium
Anurag Sharma
Indian Institute of Technology Delhi, India
Colin Sheppard
National University of Singapore, Singapore
John T. Sheridan
University College Dublin, Ireland
Tomasz Szoplik
University of Warsaw, Poland
Andrew Tescher
AGT Associates, USA
Hugo Thienpont
Vrije Universiteit Brussel, Belgium
Valentin I. Vlad
National Institute for Laser, Plasma, and Radiation Physics, and Bucharest University, Romania
Ichirou Yamaguchi
Gunma University, Japan
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