Hans Tiziani, Berneck, Switzerland, is the 2012 recipient of the Chandra S. Vikram award in recognition of his lifetime achievements in optical metrology and optical testing; his pioneering contributions to the field of high-precision microscopic surface and 3-D measurement and multisensor techniques; his work in deformation- and vibration analysis using double pulse techniques in digital holography; and his advances in heterodyne temporal speckle-pattern interferometry.
