• Conferences & Exhibitions Calendar
Town and Country Resort & Convention Center
San Diego, California, United States
9 - 13 March 2008
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Past Event Overview


Smart Structures & NDE 2008 Program Information:

2008 Highlights

The week was filled with presentations showcasing technical advancements and opportunities for information exchange and networking.

 
   


Call for Papers will begin May 2008


Overview

Smart Structures & NDE - two distinct symposia in one great location. Smart Structures draws a tightly focused audience working on materials, sensor systems, control, sensing, actuation, and damping. NDE attracts those involved in the safety and reliability of structures, infrared sensing and testing equipment, and structural monitoring.

Adaptive Structures & Mechanisms

  • Smart Structures & Vehicles
  • Actuators and Damping
  • Biomimetics and Robotic Systems
  • Multifunctional Materials
  • Embedded and Self Diagnosis Sensors
  • Modeling and Control
  • Sensor Networks
  • Real-Time NDE
  • Structural Health Monitoring



Symposium Chairs






Alison B. Flatau
Univ. of Maryland/College Park







George Y. Baaklini
NASA Glenn Research Ctr.







Donald J. Leo
Defense Advanced Research Projects Agency (DARPA)







Kara J. Peters
North Carolina State Univ.


Executive Committee


Mehdi Ahmadian, Virginia Polytechnic Institute and State Univ.

Yoseph Bar-Cohen, Jet Propulsion Lab.

Emilio P. Calius, Industrial Research Ltd. (New Zealand)

Marcelo J. Dapino, The Ohio State Univ.

L. Porter Davis, Honeywell, Inc.

Michael A. Demetriou, Worcester Polytechnic Institute

Aaron Diaz, Pacific Northwest National Lab.

Wolfgang Ecke, Institut für Physikalische Hochtechnologie e.V. (Germany)

Mehrdad N. Ghasemi-Nejhad, Univ. of Hawaii at Manoa

Victor Giurgiutiu, Univ. of South Carolina

B. Kyle Henderson, Air Force Research Lab.

Kumar V. Jata, Air Force Research Lab.

Tribikram Kundu, The Univ. of Arizona

Douglas K. Lindner, Virginia Polytechnic Institute and State Univ.

Ajit K. Mal, Univ. of California/Los Angeles

M. Brett McMickell, Honeywell, Inc.

Norbert G. Meyendorf, Univ. of Dayton

Zoubeida Ounaies, Texas A&M Univ.

Andrei M. Shkel, Univ. of California/Irvine

Peter J. Shull, The Pennsylvania State Univ.

Masayoshi Tomizuka, Univ. of California/Berkeley

Vijay K. Varadan, Univ. of Arkansas

Dietmar W. Vogel, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)

H. Felix Wu, National Institute of Standards and Technology

Chung-Bang Yun, Korea Advanced Institute of Science and Technology (South Korea)




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