SPIE Membership Get updates from SPIE Newsroom
  • Newsroom Home
  • Astronomy
  • Biomedical Optics & Medical Imaging
  • Defense & Security
  • Electronic Imaging & Signal Processing
  • Illumination & Displays
  • Lasers & Sources
  • Micro/Nano Lithography
  • Nanotechnology
  • Optical Design & Engineering
  • Optoelectronics & Communications
  • Remote Sensing
  • Sensing & Measurement
  • Solar & Alternative Energy
  • Sign up for Newsroom E-Alerts
SPIE Defense + Commercial Sensing 2018 | Register Today

SPIE Photonics Europe 2018 | Register Today!

2018 SPIE Optics + Photonics | Call for Papers




Print PageEmail Page

Solar & Alternative Energy

Spectrophotometer for all types of glass

PerkinElmer Life and Analytical Sciences, a global leader in application-focused measurement and analysis solutions, has announced the launch of a new spectrophotometer capable of testing a significantly expanded range of advanced materials, including highly reflective and anti-reflective coatings, all types of glass from clear to highly absorbing safety glass, and all types of optical filters. The LAMBDA 1050 debuted at SPIE Photonics West, Jan. 19-24, booth #1241, in San Jose, Calif.

"The LAMBDA 1050 will help material scientists in a diverse range of industries to accelerate the development of engineered materials including those designed to improve energy conservation or harness renewable energy sources," said Richard Begley, President, Analytical Sciences, PerkinElmer, Inc. He added, "The LAMBDA 1050 will offer scientists the flexibility and control they need to handle even the most demanding samples from the research laboratory to manufacturing validation."

With its unique three-detector design, the LAMBDA 1050 has a full scanning range from 175-3,300 nanometers. An InGaAs detector allows for expanded testing in the 800-2,600 nanometer range for high sensitivity measurement in the near infrared.

The system is the first commercially available spectrophotometer to include a choice of detector options in a single instrument. High-performance InGaAs integrating spheres and a proprietary universal reflectance accessory provide more accurate measurement and greater flexibility and sensitivity. Twin removable sampling compartments for standard and customized applications give further flexibility to the system.