SPIE Scanning Microscopy Program

Program Highlights:

•	Introduction and Plenary Session
•	Desk Top SEM Symposium
•	Advancements in Particle Beam Microscopy
•	Forensics Forum
•	Advancements in Scanned Probe Microscopy
•	Advancements in Particle Beam Microscopy
•	Particle Beam and Scanned Probe Modeling
•	Forensic Microscopy: Applications, Analyses and Research
•	Advancements in Optical Microscopy
•	Food Analysis using Microscopy
•	Biological

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Important Dates

Late Breaking News Abstracts:
Abstracts are still being accepted upon chair approval

Manuscripts Due:
19 April 2010

Registration Discount Deadline:
26 April 2010

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