Portola Plaza
    Monterey, California, United States
    17 - 19 May 2010
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    SPIE Scanning Microscopy Program

    Program Highlights:
     •Introduction and Plenary Session
     •Desk Top SEM Symposium
     •Advancements in Particle Beam Microscopy 
     •Forensics Forum
     •Advancements in Scanned Probe Microscopy
     •Advancements in Particle Beam Microscopy
     •Particle Beam and Scanned Probe Modeling
     •Forensic Microscopy: Applications, Analyses and Research
     •Advancements in Optical Microscopy
     •Food Analysis using Microscopy

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