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SPIE Scanning Microscopy 17 - 19 May 2010
Portola Plaza
Monterey, CA, USA

Organizing Committee

Conference Chairs


 

Michael T. Postek, National Institute of Standards and Technology (USA)

 

S. Frank Platek, U.S. Food and Drug Administration (USA)

 

Dale E. Newbury, National Institute of Standards and Technology (USA)

 

David C. Joy, The Univ. of Tennessee (USA)

Program Commitee

Eva M. Campo, Ctr. Nacional de Microelectrónica (Spain)
David L. Carroll, Wake Forest Univ. (United States)
Lucille A. Giannuzzi, FEI Co. (United States)
Brendan Griffin, Univ. of Western Australia (Australia)
R. David Holbrook, National Institute of Standards and Technology (United States)
Dennis A. Margosan, USDA Agricultural Research Service (United States)
Tim K. Maugel, Univ. of Maryland, College Park (United States)
Keana Scott, National Institute of Standards and Technology (United States)
Christopher W. Szakal, National Institute of Standards and Technology (United States)
Michael A. Trimpe, Hamilton County Coroner's Lab. (United States)
Vladimir A. Ukraintsev, Veeco Instruments Inc. (United States)
Daniel W. van der Weide, Univ. of Wisconsin, Madison (United States)
John S. Villarrubia, National Institute of Standards and Technology (United States)
András E. Vladár, National Institute of Standards and Technology (United States)
Oliver C. Wells, IBM Corp. (United States)
Delilah Wood, U.S. Food and Drug Administration (United States)

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Important Dates


Late Breaking News Abstracts:
Abstracts are still being accepted upon chair approval

Manuscripts Due:
19 April 2010

Registration Discount Deadline:
26 April 2010


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