||17 - 19 May 2010
SPIE Scanning Microscopy - For the Latest Research in Food Analysis, Forensics, and Biological Applications
SPIE Scanning Microscopy 2010, a multidisciplinary forum that seeks to advance scanning microscopy technologies and applications.
Program Sessions at a Glance
Over 75 presentations in these areas:
| •||Particle Beam Microscopy|
| •||Forensics Microscopy|
| •||Scanned Probe Modeling|
| •||Optical Microscopy|
| •||Microscopy for Food Analysis |
| •||Biological Scanning Microscopy |
SPIE Scanning Microscopy 2010
The conference for scientists and researchers to share ideas and find technical solutions, funding sources, and personal connections that help ensure their success.
Thank you to the SPIE Scanning Microscopy Organizers
Michael T. Postek, National Institute of Standards and Technology (USA)
S. Frank Platek, U.S. Food and Drug Administration (USA)
Dale E. Newbury, National Institute of Standards and Technology (USA)
David C. Joy, The Univ. of Tennessee (USA)
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