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SPIE Advanced Lithography 24 - 28 February 2013
San Jose Convention Center and San Jose Marriott
San Jose, California, USA

Call for Papers now open | EUV, Optical, Resists, Patterning, Metrology, Imprint

Call for Papers | SPIE Advanced Lithography. Click to learn more about the topic areas

Call for papers opens in May

SPIE Advanced Lithography is the world's premier semiconductor lithography conference and exhibition. The 2013 event is scheduled for 24-28 February, in San Jose, California.


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In the business? Take part in the Advanced Lithography Exhibition, a highly regarded exhibition for the industry's top semiconductor suppliers, integrators, and manufacturers.



A look back at Advanced Lithography 2012
This year's event ended Thursday 16 February after a five-day run in San Jose.
Read news, and see photos
Final Program (PDF)
Technical Abstracts
Exhitibition Guide (PDF)

More than 600 presentations highlighted the latest research

Advanced Etch Technology for Nanopatterning
Extreme Ultraviolet (EUV) Lithography
Alternative Lithographic Technologies
Metrology, Inspection, and Process Control for Microlithography
Advances in Resist Materials and Processing Technology
Optical Microlithography
Design for Manufacturability through Design-Process Integration
2012 plenary speakers

Jim Clifford

Vice President and GM, CDMA Technologies (USA)

The Mobile Wireless Phenomenon: A Continued Need for Advanced Lithography

C. Grant Willson

Professor of Chemical Engineering, University of Texas at Austin (USA)

High-Resolution Patterning: A View of the Future

Christopher J. Progler

Chief Technology Officer, Photronics Inc. (USA)

Squares Do Not Make Good Frisbees


Advanced Lithography 2012 from SPIE.TV

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