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Nanotechnology

AFM systems

JPK Instruments

JPK Instruments,manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the release of the next generation of NanoWizard® AFM systems delivering fast-scanning and super-resolution on an inverted microscope.

The boundaries for performance of analytical instrumentation are continually being pushed to the limits. In the world of atomic force microscopy, AFM, JPK Instruments have launched a new AFM system capable of delivering fast-scanning and super-resolution on a single instrument platform, the  NanoWizard® ULTRA Speed AFM. The fast scanning NanoWizard® ULTRA Speed AFM is important to users as it enables the tracking of changes in samples in real time whether the sample be imaged in air or liquid. Scanning at speeds of greater than 100Hz line rate with excellent, true atomic resolution in closed-loop mode is enabled by the enhanced low noise of scanner, position sensor and detection system. The new AFM system uses JPK's unique QITM (Quantitative Imaging) mode to provide quantitative material property mapping.

As with previous NanoWizard® systems, the ULTRA Speed AFM may be fully integrated with an inverted optical microscope thanks to its tip-scanning design and DirectOverlayTM mode for the most precise correlative microscopy. Similarly, the system provides extensive force measurement capability making measurements on single molecules or on living cells thanks to the JPK RampDesignerTM and ExperimentPlannerTM. The system is fully compatible with JPK's unsurpassed range of imaging modes and accessories especially for environmental control of the sample.

www.jpk.com