Gaylord Palms Resort & Convention Center
Orlando, Florida, United States
15 - 19 April 2018
Conference SI102
Polarization: Measurement, Analysis, and Remote Sensing XIII
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Abstract Due:
9 October 2017

Author Notification:
11 December 2017

Manuscript Due Date:
19 March 2018

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Conference Chairs
Program Committee
Program Committee continued...
  • Neelam Gupta, U.S. Army Research Lab. (United States)
  • Charles Kim, Northrop Grumman Electronic Systems (United States)
  • Michael W. Kudenov, North Carolina State Univ. (United States), College of Optical Sciences, The Univ. of Arizona (United States)
  • Joao M. Romano, U.S. Army Armament Research, Development and Engineering Ctr. (United States)
  • Joseph A. Shaw, Montana State Univ. (United States)
  • J. Scott Tyo, UNSW Canberra (Australia)

Call for
This conference will encompass all aspects of polarization in the optical regime, from measurement and analysis of polarized light in materials, optical components and optical systems, to polarization in remote sensing in terrestrial and space environments. Special emphasis will be placed on novel applications of polarization devices and instrumentation for defense and security applications. Papers are solicited on systems that exploit polarization phenomena and signatures for detection, acquisition, discrimination, or identification of objects of interest in feature rich and cluttered backgrounds and on systems that enhance understanding of polarization phenomenology and signatures. Polarization has been demonstrated to enhance target contrast, aid in target identification, assist in the penetration of scattering media, probe material surfaces, and characterize atmospheric aerosols and cloud particles. Applications for polarimetry have included air- and ground-based sensors, remote sensing, underwater imagers, medical imagery, and non-imaging sensors for environmental and industrial monitoring applications. These and other applications that exploit polarized light and polarized sensing, and systems developed for specific applications are encouraged.

Papers are solicited on the following topics:

Polarization in Remote Sensing
  • polarization sensing for defense and security applications
  • polarization based algorithms for anomaly and target identification
  • atmospheric polarization measurements and modeling
  • terrestrial and planetary surface polarization
  • agricultural crop and soil polarization and modeling
  • cloud and haze property determinations
  • astrophysical applications
  • polarimetric ladar
  • polarimetric lidar.
Polarization Properties of Materials
  • natural background materials
  • optical materials
  • liquid crystals
  • crystalline materials
  • ceramics and plastics
  • organic and biological materials.
Polarization Simulation and Modeling
  • signature modeling
  • algorithms for modeling scattering
  • algorithms for modeling surface features
  • approaches for including multiple bounces in interactions
  • modeling studies and results
  • capabilities of current modeling codes.
Mathematics of Polarization and Scattering
  • physical understanding of polarization quantities
  • mathematical descriptions of instruments
  • development in polarization calculi
  • understanding of depolarization phenomenon.
Polarization-Based Devices
  • electro-optic modulators
  • liquid crystal modulators
  • novel materials for new devices
  • novel device applications.
Polarization of Optical Elements
  • polarizers and retarders
  • thin-film coatings- phase conjugators
  • lenses, mirrors, gratings, beamsplitters
  • optical fibers and waveguides.
Polarization Analysis of Optical Systems
  • optical design with polarized light
  • instrumental polarization
  • polarization ray tracing
  • polarization aberration theory
  • thin-film design.
Polarization-Based Optical System Concepts
  • architectures and design tradeoffs
  • optical signal processors and computers
  • laser radar (lidar or ladar)
  • optical data storage
  • fiber optic sensors.
Polarization Metrology and Instrumentation
  • polarimetry
  • ellipsometry
  • polarization scattered light measurements
  • spectropolarimetry
  • imaging polarimetry
  • calibration of polarizing devices and polarization systems
  • use of calibration standards
  • characterization of polarization devices, sub-systems, and systems, and data reduction.
Polarization Properties of Sources and Detectors
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