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Optical Measurement Systems for Industrial Inspection IV
Editor(s):  Wolfgang Osten, Christophe Gorecki, Erik L. Novak
Date: 13 June 2005
Vol: 5856
*This item is only available on the SPIE Digital Library.
Optical Methods for Arts and Archaeology
Editor(s):  Renzo Salimbeni, Luca Pezzati
Date: 24 August 2005
Vol: 5857
*This item is only available on the SPIE Digital Library.
Nano- and Micro-Metrology
Editor(s):  Heidi Ottevaere, Peter DeWolf, Diederik S. Wiersma
Date: 18 August 2005
Vol: 5858
*This item is only available on the SPIE Digital Library.
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