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Prof. Feifan Zhou
Hainan Univ
Fellow Member
Prof. Jan van Stam
Karlstad University
Individual Member
Kurt Vonmetz
DATALOGIC IP TECH SRL
Individual Member
Kevin Harding
Optical Metrology Solutions LLC
Fellow Member
Dr. John Healy
University College Dublin
Senior Member
Dr. Hui Li
Univ of Chicago
Senior Member

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