SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Explore SPIE Profiles

Prof. Ton van Leeuwen
Amsterdam UMC
Fellow Member
Prof. Ofer Levi
Univ. of Toronto
Individual Member
Dr. Alison Peck
National Science Foundation
Individual Member
Dr. Steffen Schulze
Siemens EDA
Senior Member
Dr. Bryan Barnes
National Institute of Standards and Technology
Senior Member
René Liebers
3D-Micromac AG
Individual Member

Get access to all the features on SPIE Profiles

Sign in to your SPIE Account

Send messages, follow, and view contact details

Create your own SPIE Profile

Sign up with a free account. You will be able to:
  • Manage your SPIE information
  • Stand out in the SPIE Conference app
  • See your activity with the Society
  • Message other Profiles users
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Create an SPIE account