SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Prof. Jack Noble Vanderbilt Univ Senior Member	Prof. Joseph Stayman Johns Hopkins Univ Individual Member	Prof. Shijie Feng Nanjing Univ of Science and Technology Individual Member
Dr. Stuart Card Critical Technologies Inc Individual Member	Dr. Harry Levinson HJL Lithography Fellow Member	Dr. Syam Mohan Mohanan UK Health Security Agency Early Career Professional

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