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Vikram, Abhishek

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Dr. Abhishek Vikram


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Area of Expertise: Lithography, Wafer inspection, DFM, OPC Verification, Yield management, Metrology
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Dr. Abhishek Vikram (Member SPIE, Senior Member IEEE and Fellow IE and IETE organizations) has worked over 18 years in the area of application of advanced semiconductor technologies ranging development of methods, equipment's and software. He has worked in several Lithography related projects like OPC Verification, Design inspection, Pattern Monitor and Defect Detection Strategy in advanced technology nodes. He is a strong believer in people-engagement at all levels and is always challenging the failing "orthodox"‚Äč with neo-pragmatic approach to adapt to ever changing customer demand. He has worked in different engineering roles at KLA Tencor and GlobalFoundries Fab8. Currently he is working as Director- Applications Engineering and Technical Marketing at Anchor Semiconductor Inc., focusing on DFM and Defect image related research.
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