Harding, Kevin G.

Mr. Kevin G. Harding

President, CTO
Optical Metrology Solutions
Fellow Member

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Area of Expertise: Optical Metrology, 3D Metrology, Interferometry, Holography
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Summary
Kevin Harding is a Principal Scientist at GE Research. At the R&D center he leads the activity in Optical Metrology and provides guidance to a wide range of optical technology projects, doing work for the many businesses of GE. Before joining GE, as Director of the Electro-Optics Lab at the Industrial Technology Institute for 14 years, Kevin built the electro-optics business doing over 200 projects and spinning off a number (6) of commercial products. Within the technical community for over 30 years, he developed and chaired new techical conferences and workshops including the industry recognized Optics and Lighting for Machine Vision which he taught for over 15 years. Kevin Harding is internationally recognized for his expertise in 3D measurement technology, and has been recognized for this work by many organizations including:
Society of Manufacturing Engineers Outstanding Young Engineer Award 1989
Engineering Society of Detroit Leadership Award 1990
Automated Imaging Association, Leadership Award, 1994
SME (Society of Manufacturing Engineers) Eli Whitney Productivity Award 1997
SPIE President's award 2010

Kevin. Harding has published over 120 technical papers, taught over 60 short courses and tutorials to industrial and academic audiences, as well as an NTU video course on Optical Metrology, contributed sections to 7 books, and received over 57 patents. He has served on industrial advisory committees, society Committee chair and conference chair for over 25 years working with the SPIE, LIA, ESD, SME, and OSA. Kevin was the Chair of the Machine Vision Association (1991), chair of the SME Publications Committee (1993-4) and 2008 President of SPIE-the International Society for Optics and Photinics as well as a fellow of the SPIE.
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