Diani, Marco

Prof. Marco Diani

Full Professor
Univ of Pisa
Regular Member

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Area of Expertise: Hyperspectral image analysis, Hyperspectral Target detection, Infrared video processing, Hyperspectral anomaly detection, Multitemporal hyperspectral image analysis
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Summary
Marco Diani received his Master of Science degree (cum laude) in Electronic Engineering at the University of Pisa, Italy, in 1988. He holds the position of full Professor at the Italian Naval Academy. He also holds the course of "Remote Sensing" at the University of Pisa.
His recent research activity focuses on hyperspectral/multispectral image analysis and on the processing of videos acquired by thermal imagers. As to the former topic his interest is on blind methods for searching anomalous areas/objects (anomaly detection), on detecting specific materials on the basis of their spectral signature (spectral signature based object detection), and on revealing the presence of regions where changes occurred (anomalous change detection) between two repeated passes over the same area. The analysis of multi-temporal images also includes "object rediscovery" where an object, which has been identified in the first image, is located in the second one by properly compensating for the atmospheric/radiometric changes occurred between the two acquisitions. In the framework of target detection in infrared videos both the aspects of object detection and change detection have been considered.
Marco Diani is/has been coordinator for many projects at the Department of Information Engineering and at the CNIT (Consorzio Nazionale Interuniversitario Telecomunicazioni) funded by public and private institutions. He has authored/co-authored more than 150 papers, 50 of which on international peer reviewed journals. He has also authored more than 50 technical reports and final research reports. He has been a member of technical committees at international conferences. He has served as a reviewer for many journals in the fields of remote sensing and image/signal processing such as IEEE Trans. on Image Processing, IEEE Trans. on Signal Processing, IEEE Trans. Geoscience and Remote Sensing, Optical Engineering and Applied Optics. He is member of IEEE and SPIE.
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