Date and place of birth: Madrid (Spain) 1956
Education: Mechanical Engineer by ICAI-UPM and Ph.D. by the Polytechnic University of Madrid, Department of Applied Physics to Engineering.
Professional Career: In 1982 joined the National Commission of Metrology. Since 1994, Head of the Length Area at the Spanish Centre of Metrology (CEM).
Member of Consultative Committees for Length (CCL) and Units (CCU) from the International Committee of Weights and Measures (CIPM). CEM representative in EURAMET (the European Association of National Metrology Institutes) for the quantity ‘Length’.
Member of the International Society for Optical Engineering (SPIE) since 1991, the Scientific Committee of the network ‘NanoSpain’, the Dimensional Metrology Committees in ENAC (the Spanish Accreditation Body) and AENOR (the Spanish Standardization Body) and Chairman of the AENOR GET 15 Group on standardization in nanotechnologies.
Author of several publications and papers in national and international journals, has coordinated interlaboratory comparisons and R&D projects, as well as training courses on metrology and uncertainty estimation.