Maas, Diederik J.

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Dr. Diederik J. Maas

Systems Engineer
TNO


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Area of Expertise: Charged Particle Optics, Scanning Electron Microscopy, Scanning Helium ion Microscopy, Nano-imaging and -fabrication, Metrology
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Summary
Dr. D.J. Maas is presently Senior Systems Architect with TNO Science and Industry. From 1998-2006 he was Senior Scientist at Philips Research, where he developed an Electrostatic Aberration Corrector for LV-SEM.
He has obtained is PhD degree from the University of Amsterdam for work that was performed at AMOLF involving coherent control of atomic and molecular excitations using chirped ultrashort infrared laser pulses.
His undergraduate work involved experimental studies of the fractional quantum Hall effect on quantum dots that he made using electron beam lithography (See front cover Physics Today March 2002).
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