Dr. Amin Vakhshouri





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Area of Expertise: Scanning Probe Microscopy, Micro/nano fabrication, low dimensional materials, Electronic characterization, Semiconductor, Atomic Force Microscopy
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Summary
I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved fabrication and characterisation of carbon nanotube devices as well as layer materials such as atomically thin inorganic semiconductors, e.g. Molybdenum disulfide (MoS2), at nanoscales using photolithography, electron beam lithography, etching, annealing and physical vapor deposition. I characterized these materials using electron transport and scanning probe microscopy techniques.

I also employed scanning electron microscope to fabricate nanostructures on different substrates. Moreover, I have extensive experience with scanning probe microscopy including atomic force microscopy at ambient conditions in various modes, e.g. frequency/amplitude modulated, contact, and dual modes.

Developing novel combined atomic force/scanning tunneling microscopy (AFM/STM) and a method of AFM-assisted-tunneling spectroscopy, I gained my expertise in instrumentation and instrument programming.

I seek a research/material scientist position to solve engineering challenges and conduct industrial research in the field of product development and instrument systems engineering.
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