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SPIE Photomask Technology 14 - 17 September 2009
Monterey Marriott and Monterey Conference Center
Monterey, California, USA

Access the research that will keep your work moving forward and your company on the technology roadmap

The Annual SPIE/BACUS Symposium is the premier worldwide technical conference and exhibition for the photomask industry. This year's symposium will give you the chance hear the latest research on the emerging and on-going issues facing the photomask industry.

Save $100 over onsite pricing
if you register by 24 August 2009

Attend SPIE Photomask Technology, the event that for almost 30 years has presented the research that defines the future of the industry.


Program information is now available on these technical areas:

  • Mask Infrastructure
  • Mask Integration
  • Emerging Mask Technology
  • Mask Business

Download the SPIE Photomask Technology Advance Program PDF


Keynote Presentation

Global Collaboration in Semiconductors and Strategies for the Mask Industry

Dr. Michael Polcari
President and CEO
SEMATECH Inc.

Dr. Michael R. Polcari has served as SEMATECH's president and CEO since 2003. He is responsible for leading the consortium's advanced technology R&D programs in lithography, front end processes, interconnect, and metrology. Dr. Polcari has also overseen the launch of two SEMATECH subsidiaries-ATDF, as a leading R&D processing and prototyping center, and the International SEMATECH Manufacturing Initiative (ISMI), which has added seven members during his tenure.



Exhibit at SPIE Photomask Technology and keep your company on the technology roadmap

Exhibiting at SPIE Photomask Technology is your cost-effective solution for gaining visibilty with your target customers.

Intersted in networking with industry leaders, consulting with your suppliers, and seeing the latest technologies that are changing the way we live and work?



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Important Dates

Save $100 by registering online before 24 August 2009
Manuscript Due Date: 17 August 2009

Important Author Dates

Author Notification
12 May 2009

Manuscripts Due  
17 August 2009


Conference + Exhibition Updates


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