• Optical Metrology 2015
    Conferences
    Special Events
    Registration Pricing + Details
    Proceedings
Internationales Congress Center
Munich, Germany
21 - 25 June 2015
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SPIE Optical Metrology 2015

Munich, Germany

Thank you to all of those who participated at SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. Co-located with ECBO.

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View registration pricing and information for SPIE DSS 2015 View registration pricing and details
2015 Advance Programme Download the Final Programme (2 MB PDF)
Download the Technical Abstracts (1 MB PDF)

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BBC News - Science & Environment: 20 January 2015
X-ray technique reads burnt Vesuvius scroll
For the first time, words have been read from a burnt, rolled-up scroll buried by Mount Vesuvius in AD79.


2015 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

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Cooperating Organisations

 European Optical Society

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