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SPIE Europe Optical Metrology 14 - 18 June 2009
ICM-International Conference Centre Munich
Munich, Germany

Overview

Sponsor

Cooperating Organisations

Important Dates

Abstract Due Date
26 January 2009

Author Notification
16 February 2009

Onsite Manuscripts Due
6 April 2009

Post-Meeting Manuscripts Due
28 May 2009


Conference + Exhibition Updates


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