23 - 26 May 2011 ICM—International Conference Centre Munich Munich,
Germany
SPIE Optical Metrology | The Premier European Event for the Latest Research on Modeling, O3A, Videometrics
Attend SPIE Optical Metrology, the leading European event for scientists, engineers, researchers, and product developers engaged in optical metrology, videometrics, modeling, and O3A (optics for the arts, architecture, and archaeology).
SPIE Optical Metrology concluded 26 May. We thank you for your participation.
Entrance to the LASER World of PHOTONICS 2011 Exhibition
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Proceedings: Printed or CD-ROM
Program included Conferences on:
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Optical Measurement Systems for Industrial Inspection
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Modeling Aspects in Optical Metrology
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O3A: Optics for Arts, Architecture, and Archaeology
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Videometrics, Range Imaging and Applications
Co-located with LASER World of Photonics 2011 in Munich, Germany, this symposium provided an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.
