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SPIE Europe Optical Metrology 14 - 18 June 2009
ICM-International Conference Centre Munich
Munich, Germany

Overview

SPIE Europe Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

Submit an abstract and share your latest work with your colleagues

Co-located with Laser World of Photonics 2009 in Munich, Germany, this symposium will address the role of lasers in the following areas:

  • Optical Measurement Systems for Industrial Inspection
  • Modeling Aspects in Optical Metrology
  • O3A: Optics for Arts, Architecture, and Archaeology

Plan to participate by submitting an abstract or attending this essential event for optical metrology.

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Important Dates

Abstract Due Date
26 January 2009

Author Notification
16 February 2009

Onsite Manuscripts Due
6 April 2009

Post-Meeting Manuscripts Due
28 May 2009


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