SPIE Professional

January-March 2012 | Vol. 7 | Issue 1
January 2012: XFELs

This issue of SPIE Professional has articles on XFEL facilities, retinal imaging, and the SPIE optics and photonics salary survey as well as highlights from the scientific literature and previews of SPIE Photonics West 2012, SPIE Advanced Lithography, and other SPIE events.

All the articles in the print version of this issue are available as a PDF.

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