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PHASICS SA
Company Description
PHASICS, a French company based in the Paris region, manufactures high resolution (up to 400x300 simultaneous measurement points) wave front sensors based on its innovative technology: 4-wave lateral shearing interferometry. These solutions answer both scientific and industrial needs and are ideal for laser characterization and optical metrology. PHASICS also proposes adaptive optics loops for laser spot optimization and beam shaping.
Contact Information
XTEC Bât 404
Campus de l'Ecole Polytechnique
Palaiseau
France
Press Releases
| PHASICS Presents its Hi-Res Wavefront Sensors at Photonics W
Chicago, December 2, 2008 (word count: 286)
High-resolution images are available on request.
PHASICS manufactures high-resolution wavefront sensors and associated devices and software for laser characterization and optical metrology. The company will present an adaptive optics loop based on its wavefront sensor and its software to drive a deformable mirror at Photonics West 2009 in San Jose, Calif., from Jan. 27 to 29, on the French Pavilion at booth 1611.
The high-resolution wavefront sensors (SID4) are based on an innovative and patented technology: 4-wave lateral Shearing Interferometry, which offers the optimal design features for laser characterization and optical metrology: sensitivity, high resolution and dynamic range measurement.
The SID4 device gives the main information for a complete characterization of a beam in a single measurement, including:
- beam's wavefront with the aberrations (high-resolution phase map up to 160 x 120 measurement points)
- the intensity profiles with a Gaussian fit, beam size, ellipticity
- M² value (according to ISO11146 standard) and Strehl ratio for the beam quality
PHASICS adaptive optics systems offer the prospect of beam focusing optimization and beam shaping in real time. For imaging systems, the company ensures diffractive limited performances. OASys includes the high-performance SID4 wave front sensor, a deformable mirror and the software to drive both the analyser and the deformable mirror, all best suited to the application. The OASys software is dedicated to control the correction device (deformable mirror, SLM, or deformable membrane) and is linked to the SID4 main interface software.
For optical metrology, Kaleo measures at the same time the aberrations, the focal length and the MTF of spherical and aspherical optics. Our innovative technology allows characterizing highly opened optics (up to f/1.6) without any relay lens. Kaleo is particularly adapted to industry needs and allows a complete diagnostic of the lens quality.
For more information, please contact:
PHASICS
Françoise Le Doze
Administrative Assistant
XTEC Bldg. 404
Campus de l'Ecole Polytechnique
Route de Saclay
91128 Palaiseau
FRANCE
Tel: +33 (0)1 69 33 89 87
E-mail: ledoze@phasics.fr
Web: www.phasics.fr
or:
FRENCH TECHNOLOGY PRESS OFFICE
205 North Michigan Avenue, Suite 3740
Chicago, IL 60601
Fax: (312) 327-5261
E-mail: contact.ftpo@ubifrance.fr |
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