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Gatan, Inc.
Company Description
For over 45 years, Gatan, Inc. has designed and manufactured instruments and products for electron microscopes that enable and advance EM applications. Gatan is the recognized leader in the industry and our products set the industry standards. Gatan is committed to being a quality provider of high performance instrumentation for imaging and analysis in TEM and SEM applications. Our designers and engineers understand the application criteria of our customers and provide them with the best solutions for their application needs.
Contact Information
 5794 W Las Positas Blvd
Pleasanton,CA
United States
Press Releases
| Preparing planar cross sections from difficult samples for microscopic imaging and microanalysis.
The Gatan Ilion+ is a significant advance in the preparation of planar cross sections from difficult samples for microscopic imaging and microanalysis. The Ilion+ design is based on the proven Gatan PIPS™ (Precision Ion Polishing System). This field proven, robust platform represents the industry standard in broad ion beam performance and reliability with thousands of units installed world-wide. The system is easy to install and operate allowing users to begin making samples quickly.
Masked broad ion beam milling, also known as “slope cutting,” is a surface preparation technique that utilizes a large (~1mm) ion beam to strip away an extensive, finely polished area for microscopy and microanalysis. A solid sputter resistant shield blocks half the ion beam, effectively masking the lower half of the beam and creating a lateral sputtering plane that strips away a thin layer of the sample surface. The resulting planarized surface is topographically flat and free of artifacts.
The Ilion+ masked ion beam milling technique has emerged as a powerful cross section sample preparation method for materials that do not lend themselves to mechanical polishing or focused ion beam milling.
Samples are attached piggy-back to the unique Ilion+ sample blades in a positive positioning alignment jig which aids in achieving the correct sample to blade offset and parallelism. A keyed indexing system facilitates easy handling and repeatable insertion into the sample holder. Sample blades are re-useable and can be re-attached to new samples several times.
Once samples are set in place, the airlock is evacuated and the sample blade is transferred into the chamber. Since the inner chamber is always under vacuum, exchange cycle times are less than 20 seconds. A viewing window permits real-time observation of the sample milling progress. With the addition of high performance optics and a CCD camera, actual surface features can be monitored as an aid in determining the end-point of the milling sequence.
For complete product and pricing information on the Gatan Ilion+, please visit us in Booth 323 or www.gatan.com. |
| Improve the performance of your TEM or SEM and acquire better results.
Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are fully compatible with all brands of electron microscopes, cover the entire range of the analytical process from specimen preparation and manipulation to imaging and analysis. Our customer base spans the complete spectrum of end users of analytical instrumentation typically found in industrial, governmental and academic laboratories. The applications addressed by these scientists and researchers include metallurgy, semiconductors, electronics, biological science, new materials research and biotechnology. The Gatan brand name is recognized and respected throughout the worldwide scientific community and has been synonymous with high quality products and the industry's leading technology.
Please visit Gatan in Booth 323 or www.gatan.com. |
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