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Artifex Engineering e.K.
Company Description
Artifex Engineering designs and manufactures laser diode characterization systems (LIV).
We also design and manufacture systems and subsystems for industrial and R&D optoelectronic metrological applications.
As an OEM supplier, we consider our customer relationship to be a valuable asset. We understand that your application is not standard and so we offer customization of all of our products - even for single units.
Contact Information
 Dortmunder Str 16-18
Emden
Germany
Press Releases
| OPM150: Optical Power Monitor
The OPM150 is a versatile power monitor for use in the lab and for laser servicing as well as for OEM applications.
Heads are available covering 190-1100nm, 800-1550nm, 800-1650nm and 400-1600nm. Each head is automatically recognized and its individual calibration data are uploaded to the system. In addition, the user may load up to 5 separate filter curves. Thus the dynamic range and functionality of the unit can be expanded while ensuring proper calibration.
The graphical user interface is intuitive to use and easy to read! The software includes a scope function, data logging and a large, digital display – perfect for daily use in the lab or in the field. The 2-channel version of the software allows control of two units for comparison, ratio or difference measurements. Further functions such as autogain and various storage formats are also included.
The OPM150 is small enough to fit into your pocket and is USB powered and controlled. No extra power supply required, no extra cables on the table. Not only the small size qualifies this instrument for OEM applications. It is very simple and flexible to integrate into your project. The unit comes delivered with drivers for direct communication or to be used as a virtual COM-port. Furthermore, we provide a full software development kit including the source code for the GUI application as well as a demo LabView-VI. |
| LIV100: Laser Diode Characterization System
The LIV100 is a powerful test system for use in the lab as well as for OEM applications, ideal for
· Diode characterization at the chip or bar level
· Quality control of incoming goods
· OEM
The parameters measured include
· Power (threshold, slope efficiency)
· Voltage (series resistance)
· Current
· Spectrum (CWL, FWHM)
We offer this instrument with a variety of end stages covering current ranges from 1A to 400A.
A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 0.3s for 200 current steps including the data tranfer to the host computer. |
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