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SPIE Photonics West
31-January - 02-February 2017
San Francisco, CA, United States

Lumetrics, Inc.

Address
Lumetrics, Inc.
1565 Jefferson Road #420
Rochester, NY
United States
14623
Company Description
Featured Product: Adaptive optic with wavefront sensor feedback loop operating at a telecom wavelength

Lumetrics develops and manufactures non-contact thickness measurement and optical inspection systems for medical, glass, food packaging, ophthalmic, automotive, and film industries. Our breakthrough precision thickness measurement technology is fast, accurate, flexible, and scalable to most QA laboratories, R&D centers, or production lines. We provide solutions to a growing cross-section of customers in the medical, pharmaceutical, packaging, ophthalmic, and coatings industries.
Announcements
10 January 2017
OptiGauge® II
The OptiGauge® II is an ideal non-contact thickness measurement system for companies looking to move away from traditional contact measurement systems. It is non-destructive and objective, leaving no margin for operator error. It offers customers extraordinary flexibility in a measurement system. This user-friendly system delivers reliability and sub-micron accuracy so vital to today’s most advanced industries. OptiGauge II can be particularly useful in Quality, R&D labs, and production floors because it can improve yields, reduce costs, increase quality, and meet compliance requirements.
04 January 2017
Engineering Discovery Service
Over the past 15 years Lumetrics has worked closely with many customers to develop custom metrology solutions to meet specific measurement challenges.

We recognize that many other customers can also benefit from our metrology expertise thus we are proud to announce the Lumetrics Discovery Service Program.

The Lumetrics Discovery Service Program includes 15 hours of dedicated engineering support at a cost of $1,995. Once this process is complete it may result in an agreement to further pursue the discovery process, and/or a quote for a system that supports the application being considered.

Lumetrics solutions include:
-Our patented interferometric thickness measurement solution, the OptiGauge® designed to measure the absolute thickness of any translucent or light-absorbing materials. It provides real-time measurement of single or multi-layer materials.
-Our wavefront measurement systems that are ideal for analyzing optics-related products and materials from contacts lenses, intraocular lenses to laser beam analysis, surface measurement and phase parameters.

For more information please click here to download the data sheet. You can also e-mail: engineering@lumetrics.com, or call 585-214-2455 x123
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