Smart Structures & NDE 2008 Program Information:
The week was filled with presentations showcasing technical advancements and opportunities for information exchange and networking.
Call for Papers will begin May 2008
Smart Structures & NDE - two distinct symposia in one great location. Smart Structures draws a tightly focused audience working on materials, sensor systems, control, sensing, actuation, and damping. NDE attracts those involved in the safety and reliability of structures, infrared sensing and testing equipment, and structural monitoring.
Adaptive Structures & Mechanisms
- Smart Structures & Vehicles
- Actuators and Damping
- Biomimetics and Robotic Systems
- Multifunctional Materials
- Embedded and Self Diagnosis Sensors
- Modeling and Control
- Sensor Networks
- Real-Time NDE
- Structural Health Monitoring
Alison B. Flatau
Univ. of Maryland/College Park
George Y. Baaklini
NASA Glenn Research Ctr.
Donald J. Leo
Defense Advanced Research Projects Agency (DARPA)
Kara J. Peters
North Carolina State Univ.
Mehdi Ahmadian, Virginia Polytechnic Institute and State Univ.
Yoseph Bar-Cohen, Jet Propulsion Lab.
Emilio P. Calius, Industrial Research Ltd. (New Zealand)
Marcelo J. Dapino, The Ohio State Univ.
L. Porter Davis, Honeywell, Inc.
Michael A. Demetriou, Worcester Polytechnic Institute
Aaron Diaz, Pacific Northwest National Lab.
Wolfgang Ecke, Institut für Physikalische Hochtechnologie e.V. (Germany)
Mehrdad N. Ghasemi-Nejhad, Univ. of Hawaii at Manoa
Victor Giurgiutiu, Univ. of South Carolina
B. Kyle Henderson, Air Force Research Lab.
Kumar V. Jata, Air Force Research Lab.
Tribikram Kundu, The Univ. of Arizona
Douglas K. Lindner, Virginia Polytechnic Institute and State Univ.
Ajit K. Mal, Univ. of California/Los Angeles
M. Brett McMickell, Honeywell, Inc.
Norbert G. Meyendorf, Univ. of Dayton
Zoubeida Ounaies, Texas A&M Univ.
Andrei M. Shkel, Univ. of California/Irvine
Peter J. Shull, The Pennsylvania State Univ.
Masayoshi Tomizuka, Univ. of California/Berkeley
Vijay K. Varadan, Univ. of Arkansas
Dietmar W. Vogel, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
H. Felix Wu, National Institute of Standards and Technology
Chung-Bang Yun, Korea Advanced Institute of Science and Technology (South Korea)Back to top