Internationales Congress Center
    Munich, Germany
    24 - 27 June 2019
    Print PageEmail Page

    Past event overview

    Munich, Germany

    SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.


    SPIE Optical Metrology overview

    Final programme (PDF)


    SPIE Optical Metrology is part of