Past Event Overview

Register for SPIE Optical Metrology 2013

Thank you for attending SPIE Optical Metrology 2013, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest inventions and applications in the field of optical metrology.

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View the Final Programme (PDF 2.5 MB)

View the Technical Abstracts (PDF 2.2 MB)

 

2013 Programme:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging and Applications
 • Optical Methods for Inspection, Characterization and Imaging of Biomaterials
 • Automated Visual Inspection


 

All papers presented at SPIE Optical Metrology 2013
become part of the world's largest collection of
optics and photonics research papers.

SPIE Optical Metrology Conference
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SPIE Proceedings
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