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Internationales Congress Center
Munich, Germany
25 - 29 June 2017
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SPIE Optical Metrology 2017 in Munich

Munich, Germany

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

View details for the collocated event, SPIE Digital Optical Technologies 2017


SPIE Digital Optical Technologies 2017 links

Onsite registration and badge pick-up times

Final programme (5 MB PDF)

Technical abstracts (2 MB PDF)

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Plenary presentations

SPIE Plenary Session
Federico Capasso

Metasurface Diffractive Optics

Federico Capasso
Robert L. Wallace Professor of Applied Physics and Vinton Hayes Senior Research Fellow in Electrical Engineering
Harvard Univ. (USA)

Congress-wide Plenary Session
Jörg Wrachtrup

Putting a Spin on Photons

Jörg Wrachtrup
Univ. of Stuttgart (Germany)


Take a course

Take a course

Choose from four courses taught by recognised experts. Take advantage of the opportunity to receive training while you are at the event.

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Augmented Reality / Virtual Reality hands-on demos

Don't miss the AR/VR Demos

Don't miss your chance to participate in an interactive personal demo session that will allow you to try out some of the most advanced Virtual Reality (VR), Augmented Reality (AR) and Mixed Reality (MR) headsets available today. Four systems to choose from. Free for Digital Optical Technologies registered attendees.

NEW--HOLOEYE Demonstration Sessions added for Wednesday June 28. See full descriptions: http://holoeye.com/spie-digital-optical-technologies/

Learn more


2017 Conference topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

SPIE Optical Metrology is part of


Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 


Cooperating Organisations

 European Optical Society
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Important Dates

On-site Manuscripts Due
15 April 2017

Post-meeting Manuscripts Due
(O3A Conference only)
27 May 2017


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