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Internationales Congress Center
Munich, Germany
25 - 29 June 2017
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Plan for SPIE Optical Metrology 2017 in Munich

Munich, Germany

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

Browse conference papers online


Plenary Presentations

SPIE Plenary Session

Federico Capasso

Engineered Optical Functionalities through Flat Metasurfaces

Federico Capasso
Robert L. Wallace Professor of Applied Physics and Vinton Hayes Senior Research Fellow in Electrical Engineering
Harvard Univ. (USA)

Congress-wide Plenary Session

Photons, Spins and Carats: The quest for the ultimate quantum machine
Jörg Wachtrup
Univ. of Stuttgart (Germany)


2017 Conference Topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

SPIE Optical Metrology is part of


Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 


Cooperating Organisations

 European Optical Society

Important Dates

Abstracts Due
19 December 2016

Author Notification
18 Feburary 2017

On-site Manuscripts Due
15 April 2017

Post-meeting Manuscripts Due
(O3A Conference only)
27 May 2017


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