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Image Processing: Machine Vision Applications VI
Conference EI117
Part of program track on Computer Vision
This conference has an open call for papers:
Conference Chairs
Philip R. Bingham, Oak Ridge National Lab.; Edmund Y. Lam, The Univ. of Hong Kong (Hong Kong, China)
Program Committee
Pierrick T. Bourgeat, Australian e-Health Research Ctr. (Australia); Jun Cheng, Chinese Academy of Sciences (China); Michael J. Cree, The Univ. of Waikato (New Zealand); Laurent C. Duval, IFP (France); Ewald Fauster, Montan Univ. Leoben (Austria); Steven P. Floeder, 3M Co.; David Fofi, Univ. de Bourgogne (France); Luciano F. Fontoura Da Costa, Univ. de São Paulo (Brazil); Scott Gleason, National Oceanography Ctr. (United Kingdom); Olivier Laligant, Univ. de Bourgogne (France); Fabrice Meriaudeau, Univ. de Bourgogne (France); Dinesh Nair, National Instruments Corp.; Kurt S. Niel, Fachhochschule Wels (Austria); Arnau Oliver, Univ. de Girona (Spain); Vincent C. Paquit, Oak Ridge National Lab.; Jeffery R. Price, Aldis, Inc.; Ravishankar Rao, IBM Thomas J. Watson Research Ctr.; Hamed Sari-Sarraf, Texas Tech Univ.; Peter Schelkens, Vrije Univ. Brussel (Belgium); Ivan W. Selesnick, Polytechnic Institute of New York Univ.; Ralph Seulin, Univ. de Bourgogne (France); Christophe Stolz, Univ. de Bourgogne (France); Yvon Voisin, Univ. de Bourgogne (France); Gerald Zauner, FH OÖ Forschungs & Entwicklungs GmbH (Austria)
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Due Dates:
Abstract (500 words) and Summary (200 words): 23 July 2012
Manuscript for Post-Meeting Proceedings: 7 January 2013
The goal of this conference is to bring together real-world practitioners and laboratory researchers in machine vision to share recent applications and developments. Topics of interest include the integration of imaging sensors, supporting hardware, computers, and algorithms for manufacturing inspection, characterization, and/or control. The decreased cost of computational power and vision sensors has motivated the rapid proliferation of machine vision technology in a variety of industries. Examples of such industries include aluminum, automotive, forest products, textiles, glass, steel, metal casting, and chemicals. Other industries, such as semiconductor and electronics manufacturing, have been employing machine vision technology for several years. Machine vision supporting handling robots is another main topic for industrial applications. There is need of accurate, fast and robust detection of objects and their position in space. Their surface, the background and illumination is uncontrolled, in most cases the objects of interest are within a bulk of many others. For both new and existing industrial users of machine vision, there are numerous innovative methods to improve productivity, quality, and compliance with product standards.
There are several broad problem areas that have received significant attention in recent years. For example, some industries are collecting enormous amounts of image data from product monitoring systems. New and efficient methods are required to extract insight and to perform process diagnostics based on this historical record. Regarding the physical scale of the measurements, microscopy techniques are nearing resolution limits in fields such as semiconductors, biology, and other nanoscale technologies. Techniques such as resolution enhancement, model-based methods, and statistical imaging may provide the means to extend these systems beyond current capabilities. Furthermore, obtaining real-time and robust measurements in-line or at-line in harsh industrial environments is a challenge for machine vision researchers, especially when the manufacturer cannot make significant changes to their facility or process.
Abstracts are sought that are related to both novel applications of existing methodology and/or new algorithms or techniques. Abstracts are encouraged from, but not limited to, the following list of topics:
- image processing algorithms and applications
- image-related pattern recognition techniques and applications
- image-related data mining and knowledge discovery
- three-dimensional imaging (stereo, structure-from-motion, laser range finding)
- non-classical sensing
- physical imaging
- thermal, color, and/or spectroscopic imaging algorithms and applications
- novel hardware designs
- vision system architectures
- imaging and inspection in harsh environments
- machine vision for process control/diagnosis, trend analysis, or preventative maintenance
- high-throughput systems for medical or biological applications
- case studies on the impact of machine vision in manufacturing
- machine vision applications for industrial research and development
- machine vision supporting handling robots
- computational vision and imaging techniques.
Abstract submissions should be ~500 words in length and should contain all of the following information: (1) a clear problem statement and motivation for the work, (2) methods, (3) experimental results (these may be preliminary), and (4) a summary or conclusion. Submissions that do not meet these requirements will not be considered. All abstracts will be peer reviewed. Papers of exceptional quality will be invited to submit revised, extended drafts to the IS&T/SPIE Journal of Electronic Imaging.
There will be a Best Paper Award within this conference.
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Important Author Dates
Late abstract submissions may be considered. Email Megan Artz, the Program Coordinator, for more information.
Abstract Due Date
23 July 2012
Author Notification Date
28 September 2012
On-Site Proceedings
Manuscripts Due
26 November 2012
(see individual conference)
Post-Meeting Proceedings
Manuscripts Due
7 January 2013
(see individual conference)
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