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Rensselaer measurement technique maps nanomaterials as they grow

Researchers at Rensselaer Polytechnic Institute have developed a measurement technique that will help in mapping nanomaterials as they grow. The discovery, reported in the SPIE Newsroom, Proceedings of SPIE, and elsewhere by Gwo-Ching Wang, Toh-Ming Lu, and Fu Tang, could help create superior nanotechnologies and lead to the development of more efficient solar panels and increased magnetic data storage.

Rensselaer's announcement of the work notes that the technique can be quickly replicated in other labs because it uses existing technology.

In addition to an article published in the SPIE Newsroom in September 2008, the team recently reported on their work at SPIE Optics+Photonics. Wang, professor and head of physics, applied physics, and astronomy, and Lu, professor of physics, applied physics, and astronomy, have published several other papers with SPIE.