A new device made by a team of researchers led by SPIE Fellow Xiang Zhang at the University of California, Berkeley, could allow higher-resolution medical ultrasound imaging and help bridge and building inspectors detect tiny cracks or defects deep inside a structure.
The team's work was presented in the journal Nature Materials and reported in IEEE Spectrum.
Prof. Zhang has served on SPIE conference program committees including the SPIE Optics + Photonics conferences on Plasmonics: Nanoimaging, Nanofabrication, and their Applications and Photonic Fiber and Crystal Devices. He has published numerous papers with SPIE, and is scheduled for two presentations at SPIE Advanced Lithography, including one on "High-throughput maskless nanolithography using flying plasmonic lens."
Read the IEEE Spectrum article.