BELLINGHAM, Wash., USA -- SPIE's Journal of Applied Remote Sensing (JARS) is now included in Thomson Reuters databases including the Science Citation Index Expanded, SPIE has announced.
JARS papers are included beginning with Volume 1 (2007) in Science Citation Index Expanded, including the Web of Science; Current Contents/Physical, Chemical & Earth Sciences; and Current Contents/Agriculture, Biology & Environmental Sciences.
JARS is an online-only journal that covers the concepts, information, and progress of the remote-sensing community.
"The Journal of Applied Remote Sensing strives to become a leading international journal in the rapidly advancing field of remote sensing," said Wei Gao, Editor-in-Chief. "JARS is an e-journal, and features rapid publication of peer-reviewed remote sensing research and multimedia presentations. JARS has been recognized as representing high-quality, innovative, and progressive research, and extends an invitation to discerning researchers for participation. JARS is honored to be included in the Science Citation Index and looks forward to continuing to serve the remote sensing community."
Dr. Gao is the Director and Senior Research Scientist for the USDA UV-B Monitoring and Research Program and Center of Remote Sensing and Modeling for Agricultural Sustainability, Natural Resource Ecology Laboratory, at Colorado State University.
JARS features multimedia (video and audio) content, rapid article-at-a-time publication, and reference linking via CrossRef, and is published in the SPIE Digital Library. For more information about the journal, see spie.org/x3636.xml. For more information about the SPIE Digital Library, see spie.org/x2836.xml, or access the library at spiedigitallibrary.org.
SPIE is the international optics and photonics society, founded in 1955 to advance light-based technologies. Serving more than 188,000 constituents from 138 countries, the Society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth. SPIE annually organizes and sponsors approximately 25 major technical forums, exhibitions, and education programs in North America, Europe, Asia, and the South Pacific. In 2008, the Society provided $1.9 million for scholarships, grants, and other activities supporting research and education around the world. For more information, visit SPIE.org
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